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Experimental Tem and Image Simulation of <A> Dislocations in Ti3A1
Published online by Cambridge University Press: 22 February 2011
Abstract
The fine structure and the character of a dislocations on prism planes have been determined for room-temperature deformed polycrystalline Ti3Al using a combination of experimental and computational techniques of transmission electron microscopy (TEM). Within the resolution limits of the weak-beam technique the fine structure of prism plane a dislocations in Ti3Al is found to be planar and to comprise only a single ribbon of antiphase boundary and no experimentally observable stacking faults.
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- Copyright © Materials Research Society 1995