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Experimental Limitations In Impedance Spectroscopy of Materials Systems

Published online by Cambridge University Press:  10 February 2011

G. Hsieh ,
D. D. Edwards ,
S. J. Ford ,
J.-H. Hwang ,
J. Shane ,
E. J. Garboczi  and
T. O. Mason
G. Hsieh
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, [email protected]
D. D. Edwards
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, [email protected]
S. J. Ford
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, [email protected]
J.-H. Hwang
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, [email protected]
J. Shane
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, [email protected]
E. J. Garboczi
Affiliation:
Building Materials Division, National Institute of Standards and Technology, Gaithersburg, MD 20899
T. O. Mason
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, [email protected]
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Abstract

Using resistor-capacitor networks, sources of experimental artifacts in impedance spectroscopy were investigated, such sources include machine limitations, rig/cabling contributions at high frequencies, and artifacts due to high impedance reference electrodes and their geometrical placement. In the instance of electrode placement, computer simulations with a pixel-based model were in agreement with the experimental observations. Remedies for these artifacts such as rig shielding/grounding, geometrical adjustments, and null corrections are also discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 411: Symposium T – Electricaly-Based Microstructural Characterization , 1995 , 3
Copyright
Copyright © Materials Research Society 1996

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References

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