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Exelfs of Metallic Glasses

Published online by Cambridge University Press:  10 February 2011

Y. Ito ,
F. M. Alamgir ,
H. Jain ,
D. B. Williams  and
R. B. Schwarz
Y. Ito
Affiliation:
Department of Materials Science and Engineering, Lehigh University, 5 East Packer Ave.Bethlehem, PA, 18015 USA
F. M. Alamgir
Affiliation:
Department of Materials Science and Engineering, Lehigh University, 5 East Packer Ave.Bethlehem, PA, 18015 USA
H. Jain
Affiliation:
Department of Materials Science and Engineering, Lehigh University, 5 East Packer Ave.Bethlehem, PA, 18015 USA
D. B. Williams
Affiliation:
Department of Materials Science and Engineering, Lehigh University, 5 East Packer Ave.Bethlehem, PA, 18015 USA
R. B. Schwarz
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM 87545, USA
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Abstract

The feasibility of using extended energy-loss fine structure (EXELFS) obtained from ∼1 nm regions of metallic glasses to study their short-range order has been examined. Ionization edges of the metallic glasses in the electron energy-loss spectrum (EELS) have been obtained from PdNiP bulk metallic glass and Ni2P polycrystalline powder in a transmission electron microscope. The complexity of EXELFS analysis of L- and M-ionization edges of heavy elements (Z>22, i.e. Ni and Pd) is addressed by theoretical caluculations using an ab initio computer code, and its results are compared with the experimental data.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 554: Symposium MM – Bulk Metallic Glasses , 1998 , 31
Copyright
Copyright © Materials Research Society 1999

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References

1. Qian, M., Sarikaya, M., Stern, E.A., Ultramicroscopy, 59 137 (1995).Google Scholar
2. Zabinsky, S.I., Rehr, J.J., Ankudinov, A., Albers, R.C., Eller, M., J.Phys. Rev. B 52 2995 (1995).Google Scholar
3. Almagir, F.M., Ito, Y., Jain, H., Williams, D.B., Schwarz, R.B., 1998 MRS Fall Meeting, Boston, MA, 1998 (these proceedings).Google Scholar
4. Egerton, R.F., Electron energy-loss spectroscopy in the electron microscope. 2nd ed. (Plenum Press, New York, 1996). p. 485.Google Scholar
5. Boothroyd, C.B., Sato, K., Yamada, K., in Proc. XIlth Int. Cong. Electron Microscopy. (San Francisco Press, San Francisco, 1990) p80.Google Scholar
6. Ressler, T., J. Physique IV, 7 C2–269 (1997).Google Scholar
7. Okamoto, J.K., Ahn, C.C., Fultz, B., in Microbeam analysis, edited by Howitt, D.G.. (San Francisco Press, San Francisco, 1991) pp. 273.Google Scholar
8. Gaskell, P.H., J. Non Cryst. Solids, 32 207 (1979).Google Scholar
9. Leapman, R.D., Grunes, L.A., Fejes, P.L., Silcox, J., in EXAFS spectroscopy, edited by Teo, B.K. and joy, D.C. (Plenum Press, New York, 1981). p217 Google Scholar