Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-25T15:52:57.439Z Has data issue: false hasContentIssue false

Excitons in Low-Dimensional Systems: Conjugated Polymers and Semiconductor Surfaces

Published online by Cambridge University Press:  15 February 2011

Michael Rohlfing*
Affiliation:
Institut für Theoretische Physik II, Universität Münster, Wilhelm-Klemm-Str. 10, D-48149 Münster, Germany
Get access

Abstract

We investigate the formation of excitons in low-dimensional semiconducting systems. To this end a recently developed ab initio approach is employed to determine the excitation energies and optical transition matrix elements of bound and unbound excitonic states. From these results the optical spectrum can be evaluated. We discuss two classes of low- dimensional prototype materials: conjugated polymers and a semiconductor surface. Due to the reduced dimensionality, the excitonic binding energies are much larger than in con- ventional semiconductors.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Greenham, N. C. and Friend, R. H., in Solid State Physics, Advances in Research and Application, edited by Ehrenreich, H. and Spaepen, F., (Academic, New York, 1995), vol. 49, p. 1; A. J. Heeger et al., Rev. Mod. Phys. 60, 781 (1988).Google Scholar
[2] Northrup, J. E., Hybertsen, M. S., and Louie, S. G., Phys. Rev. Lett. 66, 500 (1991); L. Reining and R. Del Sole, Phys. Rev. Lett. 67, 3816 (1991).Google Scholar
[3] Onida, G. et al. , Phys. Rev. Lett. 75, 818 (1995); S. Albrecht, L. Reining, R. Del Sole, and G. Onida, Phys. Rev. Lett. 80, 4510 (1998).Google Scholar
[4] Benedict, L. X., Shirley, E. L., and Bohn, R. B., Phys. Rev. Lett. 80, 4514 (1998).Google Scholar
[5] Rohlfing, M. and Louie, S. G., Phys. Rev. Lett. 81, 2312 (1998); ibid. 82, 1959 (1999); ibid. 83, 856 (1999).Google Scholar
[6] Kohn, W. and Sham, L., Phys. Rev. 140, A1133 (1965).Google Scholar
[7] Hedin, L., Phys. Rev. 139, A796 (1965); L. Hedin and S. Lundqvist, in Solid State Physics, Advances in Research and Application, edited by F. Seitz, D. Turnbull, and H. Ehrenreich (Academic, New York, 1969), Vol. 23, p. 1;Google Scholar
[8] Hybertsen, M. S. and Louie, S. G., Phys. Rev. Lett. 55, 1418 (1985); R. W. Godby, M. Schliiter, and L. J. Sham, Phys. Rev. Lett. 56, 2415 (1986); M. Rohlfing, P. Kriiger, and J. Pollmann, Phys. Rev. B 48, 17 791 (1993).Google Scholar
[9] Sham, L. J. and Rice, T. M., Phys. Rev. 144, 708 (1966); W. Hanke and L. J. Sham, Phys. Rev. Lett. 43, 387 (1979); G. Strinati, Phys. Rev. Lett. 49, 1519 (1982); Rivista del Nouvo Cimento 11, 1 (1988).Google Scholar
[10] Rohlfing, M. and Louie, S. G., in preparation.Google Scholar
[11] Bachelet, G. B., Hamann, D. R., and Schliiter, M., Phys. Rev. B 26, 4199 (1982).Google Scholar
[12] Rohlfing, M., Kriiger, P., and Pollmann, J., Phys. Rev. B 52, 1905 (1995).Google Scholar
[13] Yannoni, C. S. and Clarke, T. C., Phys. Rev. Lett. 51, 1191 (1983); G. Leising, Phys. Rev. B 38, 10 313 (1988); C. H. Choi, M. Kertesz, and A. Karpfen, J. Chem. Phys. 107, 6712 (1997); E. C. Ethridge, J. L. Fry, and M. Zaider, Phys. Rev. B 53, 3662 (1996).Google Scholar
[14] Huber, K.P. and Herzberg, G., Molecular Spectra and Molecular Structure, Vol. IV: Constants of Diatomic Molecules (Van Nostrand, New York 1979).Google Scholar
[15] Tian, B. et al. , J. Chem. Phys. 95, 3191 (1991); K. Pichler et al., J. Phys. Cond. Matter 5, 7155 (1993); D. A. Halladay et al., Synthetic Metals 55-57, 954 (1993); S. F. Alvarado et al., Phys. Rev. Lett. 81, 1082 (1998); S. Mukamel et al., Science 277, 781 (1997).Google Scholar
[16] Osterbacka, R. et al. , private communication.Google Scholar
[17] Pandey, K. C., Phys. Rev. Lett. 49, 223 (1982).Google Scholar
[18] Uhrberg, R. I. G., Hansson, G. V., Nicholls, J. M., and Flodström, S. A., Phys. Rev. Lett. 48, 1032 (1982); P. Perfetti, J. M. Nicholls, and B. Reihl, Phys. Rev. B 36, 6160 (1987).Google Scholar
[19] Chiaradia, P., Cricenti, A., Selci, S., and Chiarotti, G., Phys. Rev. Lett. 52, 1145 (1984).Google Scholar
[20] Selci, S. et al. , J. Vac. Sci. Technol. A 5, 327 (1987);Google Scholar
[21] Ciccacci, F., Selci, S., Chiarotti, G., and Chiaradia, P., Phys. Rev. Lett. 56, 2411 (1986).Google Scholar