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Exafs Studies of Semiconductors

Published online by Cambridge University Press:  26 February 2011

Bruce A. Bunker
Bruce A. Bunker*
Affiliation:
University of Notre Dame, Physics Dept., Notre Dame, IN 46556
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Abstract

Recent results from EXAFS spectroscopy are discussed, including (i) the determination of the site and local bond lengths of Fe impurities implanted into Si, (ii) the determination of the ferroelectric phase transition in Pb1−x Gex Te as order-disorder rather than displacive, and (iii) the nondestructive measurement of Aℓ diffusion into GaAs at an Aℓ/GaAs Interface.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 77: Symposium D – Interfaces, Superlattices, and Thin Films , 1986 , 99
Copyright
Copyright © Materials Research Society 1987

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References

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