Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-27T02:31:58.119Z Has data issue: false hasContentIssue false
  • English
  • Français

Evaluation of Segregation in Polycrystalline 10 mol% Yttria Doped Zirconia (10YSZ)

Published online by Cambridge University Press:  20 September 2011

Muhammad Asri Idris ,
Janusz Nowotny  and
Sean S. Li
Muhammad Asri Idris
Affiliation:
School of Materials Science and Engineering, The University of New South Wales, Sydney, New South Wales, AUSTRALIA School of Materials Science and Engineering, University Malaysia Perlis, Kubang Gajah, Perlis, MALAYSIA
Janusz Nowotny
Affiliation:
Solar Energy Technologies, School of Natural Sciences, University of Western Sydney, Penrith South DC, New South Wales, AUSTRALIA
Sean S. Li
Affiliation:
School of Materials Science and Engineering, The University of New South Wales, Sydney, New South Wales, AUSTRALIA
Get access

Abstract

The present work reports surface segregation in polycrystalline yttria-stabilised zirconia (cubic) including 10 mol% Y2O3 (10YSZ). The 10YSZ specimen was annealed in the range 1073 K - 1673 K in the gas phase of controlled oxygen activity. The segregation-induced intensity profiles of 89Y, 40Ca, 28Si, 27Al, 133Cs, 197Au and 90Zr was measured using secondary ion mass spectrometry (SIMS). The data obtained show that (i) annealing of 10YSZ results in the formation of segregation-induced concentration gradients of 89Y, 40Ca, 28Si, 27Al and (ii) segregation-induced profiles depend on oxygen activity.

Keywords

surface chemistrysecondary ion mass spectroscopy (SIMS)x-ray diffraction (XRD)
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1363: Symposium RR – Fundamental Science of Defects and Microstructure in Advanced Materials for Energy , 2011 , mrss11-1363-rr05-07
Copyright
Copyright © Materials Research Society 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Winnubst, A. J. A., Kroot, P. J. M., and Burggraaf, A. J., “ AES/STEM grain boundary analysis of stabilized zirconia ceramics,” Journal of Physics and Chemistry of Solids, vol. 44, pp. 955–960, 1983.Google Scholar
[2] Nowotny, J., Bak, T., Nowotny, M. K., and Sorrell, C. C., “ Charge transfer at oxygen/zirconia interface at elevated temperatures: Part 3: Segregation induced interface properties,” Advances in Applied Ceramics, vol. 104, pp. 165–173, 2005.Google Scholar
[3] Cahn, J. W. and Hilliard, J. E., “ On the equilibrium segregation at a grain boundary,” Acta Metallurgica, vol. 7, pp. 219–221, 1959.Google Scholar
[4] Bitler, W. R., “ Equilibrium grain boundary segregation,” Scripta Metallurgica, vol. 5, pp. 1045–1048, 1971.Google Scholar
[5] Seah, M. P. and Hondros, E. D., “ Grain Boundary Segregation,” Proceedings of the Royal Society of London. A. Mathematical and Physical Sciences, vol. 335, pp. 191–212, October 30, 1973 1973.Google Scholar
[6] Burggraaf, A. J., Van Hemert, M., Scholten, D., and Winnubst, A. J. A., “ Reactivity of Solids 1984: International Symposium Proceedings ” in Materials Science Monographs. vol. 28, Baret, P. and Dufour, L. C., Eds., ed Amsterdam: Elsevier, 1985, pp. 797–802.Google Scholar
[7] Nowotny, J., Bak, T., and Sorrell, C. C., “ Charge transfer at oxygen/zirconia interface at elevated temperatures: Part 6 Work function measurements,” Advances in Applied Ceramics, vol. 104, pp. 188–194, 2005.Google Scholar
[8] Majumdar, D. and Chatterjee, D., “ X-ray photoelectron spectroscopic studies on yttria-stabilized zirconia and its surface transformations,” Thin Solid Films, vol. 206, pp. 349–354, 1991.Google Scholar
[9] Kondoh, J., “ Origin of the hump on the left shoulder of the X-ray diffraction peaks observed in Y2O3-fully and partially stabilized ZrO2,” Journal of Alloys and Compounds, vol. 375, pp. 270–282, 2004.Google Scholar
[10] Pomfret, M. B., Stoltz, C., Varughese, B., and Walker, R. A., “ Structural and Compositional Characterization of Yttria-Stabilized Zirconia: Evidence of Surface-Stabilized, Low-Valence Metal Species,” Analytical Chemistry, vol. 77, pp. 1791–1795, 2005.Google Scholar
[11] Duwez, P., Frank, J., Brown, H., and Odell, F., “ The Zirconia-Yttria System,” Journal of the Electrochemical Society, vol. 98, pp. 356–362, 1951.Google Scholar
[12] Chistyi, I. L., Fabelinskii, I. L., Kitaeva, V. F., Osiko, V. V., Pisarevskii, Y. U. V., Sil’Vestrova, I. M., and Sobolev, N. N., “ Experimental study of the properties of ZrO2-Y2O3 and HfO2-Y2O3 solid solutions,” Journal of Raman Spectroscopy, vol. 6, pp. 183–192, 1977.Google Scholar
[13] Hughes, A. E. and Badwal, S. P. S., “ Impurity and yttrium segregation in yttria-tetragonal zirconia,” Solid State Ionics, vol. 46, pp. 265–274, 1991.Google Scholar
[14] Hughes, A. E., “ Segregation in Single-Crystal Fully Stabilized Yttria-Zirconia,” Journal of the American Ceramic Society, vol. 78, pp. 369–378, 1995.Google Scholar
[15] Nowotny, J., Sorrell, C. C., and Bak, T., “ Segregation in zirconia: equilibrium versus non-equilibrium segregation,” Surface and Interface Analysis, vol. 37, pp. 316–324, 2005.Google Scholar
[16] Hughes, A. E., “ X-ray photoelectron spectroscopy study of segregation phenomena in yttria-zirconia solid electrolytes ” Ph.D., Royal Melbourne Institute of Technology, 1990.Google Scholar
[17] Hughes, A. E. and Sexton, B. A., “ XPS study of an intergranular phase in yttria-zirconia,” Journal of Materials Science, vol. 24, pp. 1057–1061, 1989.Google Scholar