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Epitaxial Growth and Structure of Cubic and Pseudocubic Perovskite Films on Perovskite Substrates

Published online by Cambridge University Press:  15 February 2011

P. A. Langjahr ,
T. Wagner ,
M. RÜhle  and
F. F. Lange
P. A. Langjahr
Affiliation:
Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaft, 70174 Stuttgart, Germany
T. Wagner
Affiliation:
Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaft, 70174 Stuttgart, Germany
M. RÜhle
Affiliation:
Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaft, 70174 Stuttgart, Germany
F. F. Lange
Affiliation:
Materials Department, College of Engineering, University of California, Santa Barbara, CA 93106, USA
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Abstract

Cubic and pseudocubic perovskite films on perovskite substrates are used to study the influence of the lattice mismatch on the epitaxial growth of thin films on substrates of the same structure. For the growth of the films, a metalorganic decomposition route (MOD) using 2-ethylhexanoates and neodecanoates as precursors, was developed. The decomposition of the precursors was investigated with thermogravimetric analysis (TGA) and x-ray diffraction (XRD). The films were spin-coated on (001)-oriented SrTiO3- and LaAlO3-substrates, pyrolyzed and afterwards annealed between 600°C and 1200°C. XRD-nvestigations and conventional transmission electron microscopy (CTEM) show, that epitaxial films with the orientation relationship [100](001) film ║ [100](001) substrate can be grown. With XRD, it could be shown, that not only ternary oxide films (SrZrO3, BaZrO3 and BaCeO3), but also perovskite solid solution films (SrTi0.5Zr0.5O3and BaCe0.5Zr0.5O3) can be prepared. Strong interdiffusion, detected by a shift of the film lattice parameter towards the substrate lattice parameter was found in SrZrO3- and BaZrO3-films on SrTiO3, annealed at temperatures above 1050°C. High resolution electron microscopy (HREM) studies of SrZrO3 on SrTiO3 show that a crystalline semicoherent interface with a periodical array of misfit dislocations is present.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 401: Symposium G – Epitaxial Oxide Thin Films II , 1995 , 109
Copyright
Copyright © Materials Research Society 1996

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References

1. Mantese, J.V., Micheli, A.L., Hamdi, A.H. and Vest, R.W., MRS Bulletin XIV, 48 (1989).Google Scholar
2. Vest, R.W. in Ceramic Films and Coatings, edited by Wachtmann, J.B. and Haber, R.A. (Noyes Publications, Park Ridge, NJ 1993), pp. 303–347.Google Scholar
3. Lange, F.F. in Proc. Recrystallization '92, edited by Fuentes, M. and Sevillano, J. Gil (Trans Tech Publications, Germany, UK, USA, 1992), pp. 81–90.Google Scholar
4. Dansheng, Y., Yuandong, D., Rangjiao, L. and Shiguang, W., Chinese Journal of Low Temperature Physics 15, 410 (1993).Google Scholar
5. Veirman, A.E.M. De, Cillessen, J.F.M., Keijser, M. de, Wolf, R.M., Taylor, D.J., Staals, A.A. and Dormans, G.J.M., Mat. Res. Soc. Symp. Proc. 341, 329 (1994).Google Scholar
6. Veirman, A.E.M. De, Timmers, J., Hakkens, F.J.G., Cillesen, J.F.M. and Wolf, R.M., Philips J. Res. 47, 185 (1993).Google Scholar
7. Taylor, D., Br. Ceram. Trans. J. 84, 181 (1985).Google Scholar
8. JCPDS file, # 22–74, 6–399, 35–734, 31–22, 10–268.Google Scholar
9. Strecker, A., Salzberger, U. and Mayer, J., Prakt. Metallogr. 30, 481 (1993).Google Scholar
10. Henney, J.W. and Jones, J.W.S., Trans. Brit. Ceram. Soc., 68, 213 (1969).Google Scholar