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Emission Light from Prism/Silver/Molecular Ultrathin Films and Excitations of Multiple Surface Plasmons in ATR Kretschmann Configuration

Published online by Cambridge University Press:  17 March 2011

Futao Kaneko ,
Takayuki Nakano ,
Toshiharu Sato ,
Kazunari Shinbo ,
Keizo Kato ,
Takahiro Kawakami  and
Takashi Wakamatsu
Futao Kaneko
Affiliation:
Dept. of Electrical and Electronics, Niigata University, Niigata 950-2181, Japan
Takayuki Nakano
Affiliation:
Graduate School of Sci. and Tech., Niigata University, Niigata 950-2181, Japan
Toshiharu Sato
Affiliation:
Graduate School of Sci. and Tech., Niigata University, Niigata 950-2181, Japan
Kazunari Shinbo
Affiliation:
Dept. of Electrical and Electronics, Niigata University, Niigata 950-2181, Japan
Keizo Kato
Affiliation:
Graduate School of Sci. and Tech., Niigata University, Niigata 950-2181, Japan
Takahiro Kawakami
Affiliation:
Dept. of Electrical and Electronics, Niigata University, Niigata 950-2181, Japan
Takashi Wakamatsu
Affiliation:
Dept. of Electrical Eng., Ibaraki National College of Tech., Hitachinaka, Japan
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Abstract

Emission light through the prism has been investigated from the Kretschmann configuration of the prism/ Ag thin film/ rhodamine-B (RB) LB film in the resonant excitation of the attenuated total reflection (ATR) measurement. The emission light and the spectra strongly depended upon the emission angles where the light was observed. The emission properties corresponded to the dispersion relation of the resonant excitations of surface plasmons (SPs) in the ATR configuration. It was concluded that the emission light was caused by multiple excitations of SPs in the ATR configuration. It is thought that the phenomenon will be used as a new sensing device.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 710: Symposia DD – Polymer Interfaces and Thin Films , 2001 , DD12.17.1
Copyright
Copyright © Materials Research Society 2002

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References

REFERENCES

1. Agranovich, V.M. and Mills, D.L. (eds.), “Surface Polaritons”, North-Holland, Amsterdam, (1982).Google Scholar
2. Kaneko, F., Honda, S., Fukami, T., Shinbo, K., Kato, K and Wakamatsu, T., Thin Solid Films, 284–285, 417(1996).Google Scholar
3. Baba, A., Kaneko, F., Shinbo, K., Kato, K., Kobayashi, S. and Wakamatsu, T., Jpn. J. Appl. Phys., 37, 2581 (1998).Google Scholar
4. Kato, K., Dooling, C.M., Shinbo, K., Richardson, T.H., Kaneko, F., Tregonning, R., Vysotsky, M.O. and Hunter, C.A., Thin Solid Films, (2001) in press.Google Scholar
5. Shinbo, K., Ebe, T., Kaneko, F., Kato, K. and Wakamatsu, T., Institute of Electronics,* Information* and Communication Engineers, Trans.on Electronics E82–C, 1098 (2000).Google Scholar
6. Kato, K., Terakado, M., Shinbo, K., Kaneko, F., Wakamatsu, T., Thin Solid Films, 393, 97 (2001).Google Scholar
7. Shinbo, K., Honma, K., Terakado, M., Nakano, T., Kato, K., Kaneko, F., Wakamatsu, T., “Novel Methods to Study Interfacial Layers” ed. Möbius, D. and Miller, R. (Elsiveir, 2001) pp.71–83.Google Scholar
8. Nakano, T., Wakamatsu, T., Kobayashi, H., Shinbo, K., Kaneko, F., Kato, K. and Kawakami, T.,* Mol. Cryst. Liq. Cryst. (2001) in press.Google Scholar
9. Nakano, T., Kobayashi, H., Shinbo, K., Kato, K., Kaneko, F., Wakamatsu, T., and Kawakami, T., 2000 MRS Fall Meeting Proceeding, JJ-8.35 (2001).Google Scholar
10. Nakano, T., Terakado, M., Shinbo, K., Kato, K., Kaneko, F., Kawakami, T., Wakamatsu, T., 2001 Int.Conf.on Solid State Devices and Materials, Tokyo, P–3–2, 670 (2001).Google Scholar