No CrossRef data available.
Article contents
Emission Energy Dependence of Transient Photoluminescence in Hydrogenated Amorphous Silicon
Published online by Cambridge University Press: 25 February 2011
Abstract
The dependence upon emission energy of the transient photoresponse of photoluminescence in amorphous silicon in the time range 100 ns to 20 μs, and for temperatures between 100 K and 160 K has been the subject of a detailed study. Analysis of this dependence, as a function of temperature, is carried out in terms of band tail carrier thermalisation and recombination. By using the simple multiple trapping treatment for the thermalisation of photoexcited carriers in their respective band tails, and by allowing for a fast time- and temperaturedependent recombination through defects deep in the gap, we are able to reproduce the correct energy and time dependence, as well as the temperature behaviour. On the basis of this analysis, the significance of the dispersive parameters deduced from transient photoluminescence decays is discussed. Comparison with the results of transient experimental techniques such as time of flight will be given.
- Type
- Research Article
- Information
- Copyright
- Copyright © Materials Research Society 1989