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Emission Characteristics of GaN-Based EL Device with AC Operation

Published online by Cambridge University Press:  17 March 2011

Tohru Honda
Affiliation:
Department of Electronic Engineering, Kohgakuin University2665-1 Nakano-machi, Hachiohji, Tokyo 192-0015, Japan
Hideo Kawanishi
Affiliation:
Department of Electronic Engineering, Kohgakuin University2665-1 Nakano-machi, Hachiohji, Tokyo 192-0015, Japan
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Abstract

GaN-based electroluminescence devices (ELDs) were fabricated using a GaN powder as an emission layer. The electroluminescence spectra of the GaN ELDs under AC operation were observed at room temperature. The emission characteristics of GaN-based ELDs were studied to compare the EL spectra and the cathodoluminescence (CL) spectra. It was clarified that the EL spectra were similar to the CL spectra of a GaN emission layer. The emission peaks in the EL spectra were shifted toward the high-energy side with increasing operation frequency.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

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References

REFERENCES

[1] Akasaki, I., Amano, H. and Suemune, I.: Inst. Phys. Conf. Ser. 142, (1996) 7.Google Scholar
[2] Nakamura, S. and Fasol, G.: The Blue Laser Diode (Springer-Verlag, Berlin, 1997).Google Scholar
[3] Garter, M., Birkhahn, R., Steckl, A. J. and Scofield, J.: MRS Internet J. Nitride Semicond. Res. 4S1 (1999) G11.3.Google Scholar
[4] Steckl, A. J. and Zavada, J. M.: MRS Bull. 24(9) (1999) 33.Google Scholar
[5] Morishima, S., Maruyama, T. and Akimoto, K.: J. Cryst. Growth 209, (2000) 378.Google Scholar
[6] Heikenfield, J. and Steckl, A. J.: Materials Research Society 2000 Fall Meeting, Boston, MA, G10.4 (2000).Google Scholar
[7] Kanie, H., Kawano, T. and Koami, H.: Blue Laser and Light Emitting Diodes II, Ed. Onabe, K., Hiramatsu, K., Itaya, K. and Nakano, Y., Ohmsha, Tokyo, 1998, p. 552.Google Scholar
[8] Hiroki, M., Asahi, H., Tampo, H., Asami, K. and Gonda, S.: J. Cryst. Growth 209 (2000) 387.Google Scholar
[9] Schineller, B., Guttzeit, A., Vertommen, F., Schön, O., Heuken, M., Heime, K. and Beccard, R.: Cryst, J., Growth 189/190, (1998) 798.Google Scholar
[10] Maruska, H. P. and Tietjen, J. J.: Appl. Phys. Lett. 15, (1969) 327.Google Scholar
[11] Nahm, K. S., Ahn, S. H. and Lee, S. H.: Tech. Digest of International Workshop on Nitride Semiconductors, Nagoya, Japan, PTD32 (2000).Google Scholar
[12] Hara, K., Matsuo, Y. and Matsuno, Y.: Materials Research Society 2000 Fall Meeting, Boston, MA, G3.31 (2000).Google Scholar