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Emission and HR-XRD study in InAs quantum dot structures prepared at different QD’s growth temperatures

Published online by Cambridge University Press:  13 March 2013

Leonardo G. Vega Macotela  and
Tetyana V. Torchynska
Leonardo G. Vega Macotela
Affiliation:
E.S.I.M.E, National Polytechnic Institute, Mexico D. F. 07738, Mexico
Tetyana V. Torchynska
Affiliation:
E.S.F.M, National Polytechnic Institute, Mexico D. F. 07738, Mexico
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Abstract

Papers in the Appendix were published in electronic format as Volume 1534

Keywords

luminescencex-ray diffraction (CRD)Nanostructure
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1534: Symposium 6B – Low-Dimensional Semiconductor Structures , 2013 , pp. A75 - A80
Copyright
Copyright © Materials Research Society 2013 

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References

REFERENCES

Bimberg, D., Grundman, M., Ledentsov, N. N., Quantum Dot Heterostructures, Ed. Wiley & Sons (2001) 328.Google Scholar
Chen, J.F., Wang, P.Y., Wang, J.S., Chen, N.C., Guo, X.J., Chen, Y.F., J. Appl. Phys. 87, 1251 (2000).CrossRefGoogle Scholar
Liu, G. T., Stintz, A., Li, H., Malloy, K. J. and Lester, L. F., Electron Lett, 35, 1163 (1999).CrossRefGoogle Scholar
Amtout, A., Raghavan, S., Rotella, P., von Winckel, G., Stinz, A., Krishna, S., J. Appl. Phys. 96, 3782 (2004).CrossRefGoogle Scholar
Attaluri, R.S., Shao, J., Posani, K.T., Lee, S.J., Brown, J.S., Stintz, A., Krishna, S., J. Vac. Sci. Technol. B, 25, 1186 (2007).CrossRefGoogle Scholar
Torchinskaya, T.V., Opto-Electronics Review, 6 (2), 121 (1998).Google Scholar
Haft, D., Warburton, R. J., Karrai, K., Huant, S., Medeiros-Ribeiro, G., Garsia, J. M., Schoenfeld, W., Petroff, P. M., Appl. Phys. Lett.., 78, 2946 (2001).CrossRefGoogle Scholar
Geller, M., Marent, A., Nowozin, T., Feise, D., Potschke, K., Akcay, N., Oncana, N., Bimberg, D., Physica E, 40, 1811 (2008).CrossRefGoogle Scholar
Kamiya, I., Tanaka, I., Tanaka, K., Yamada, F., Shinozuka, Y., and Sakaki, H.: Physica E 13, 131 (2002).CrossRefGoogle Scholar
Torchynska, T. V., Casas Espinola, J. L., Borkovska, L. V., Ostapenko, S., Dybic, M., Polupan, O., Korsunska, N. O., Stintz, A., Eliseev, P. G., Malloy, K. J., J. Appl. Phys., 101, 024323 (2007).CrossRefGoogle Scholar
Karrai, K., Warburton, R. J., Schulhauser, C., Hogele, A., Urbaszek, B., McGhee, E. J., Govorov, A. O., Garcia, J. M., Gerardot, B. D., and Petroff, P. M.: Nature 427, 135 (2004).CrossRefGoogle Scholar
Torchynska, T. V., J. Appl. Phys. 104 (7), 074315 (2008).CrossRefGoogle Scholar
Dybiec, M., Ostapenko, S., Torchynska, T. V., Losada, E.Velasquez, Appl.Phys.Lett. 84, 5165 (2004).CrossRefGoogle Scholar
Dybiec, M., Ostapenko, S., Torchynska, T. V., Lozada, E.Velasquez, Eliseev, P. G., Stintz, A., Malloy, K. J., phys. stat. sol. (c), 2, 2951 (2005).CrossRefGoogle Scholar
Dybiec, M., Borkovska, L., Ostapenko, S., Torchynska, T. V., Espinola, J. L. Casas, Stintz, A. and Malloy, K. J., Applid. Surface Science, 252, 5542 (2006).CrossRefGoogle Scholar
Torchynska, T. V., Ostapenko, S., Dybic, M., Phys. Rev. B, 72, 195341 (2005).CrossRefGoogle Scholar
Torchynska, T. V., J. Appl. Phys. 104, 074315 (2008).CrossRefGoogle Scholar
Thompson, R. M., Stevenson, R. M., Shields, A. J., Farrer, I., Lovo, C. J., Ritchie, D. A., Leadbeater, M. L., Pepper, M., Phys. Rev. B 64, 201302 (2001).CrossRefGoogle Scholar
Stintz, A., Liu, G. T., Gray, L., Spillers, R., Delgado, S. M., Malloy, K. J., J. Vac. Sci. Technol. B 18, 1496 (2000).CrossRefGoogle Scholar
Li, H., Mei, T., Zhang, W. D.H., Yoon, S.F. and Yuan, H.. J. Appl. Phys. 98, 054905 (2005).CrossRefGoogle Scholar
Mukhopadhyay, P., Das, P, Pathak, S, Chang, E. Y., Biswas, D.. CS MANTECH Conference, Palm Springs, California, USA (2011)Google Scholar
Zhang, B., Solomon, G. S., Pelton, M., Plant, J., Santori, CH, et al. . J. Appl. Phys. 97, 073507 (2005).CrossRefGoogle Scholar
Dybiec, M., Ostapenko, S., Torchynska, T. V., Lozada, E.Velasquez, Eliseev, P. G., Stintz, A., Malloy, K. J., phys. stat. sol. (c), 2, 2951 (2005).CrossRefGoogle Scholar