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Published online by Cambridge University Press: 21 February 2011
A method has been developed to analyze mercuric iodide (HgI2) for elemental contamination using Inductively Coupled Plasma/Mass Spectroscopy (ICP/MS). This paper will discuss the ICP/MS method, the effectiveness of purification schemes for removing impurities from Hgl2, as well as preliminary correlations between HgI2 detectorperformance and elemental contamination levels.