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Electrooptic Properties of Pzt thin Films for Image Storage Applications

Published online by Cambridge University Press:  25 February 2011

D. Dimos
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185
R.W. Schwartz
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185
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Abstract

The photocurrent responses, photo-induced changes in hysteresis behavior, and electrooptic (birefringence) effects of sol-gel derived PZT films have been characterized as part of an effort to evaluate ferroelectric films for image storage and processing applications.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

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