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Electronic transport properties of atomic scale graphene/metal side contact

Published online by Cambridge University Press:  17 July 2013

Bo Ma ,
Yanwei Wen ,
Xiao Liu  and
Bin Shan
Bo Ma*
Affiliation:
School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, Hubei, People’s Republic of China
Yanwei Wen*
Affiliation:
School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, Hubei, People’s Republic of China
Xiao Liu
Affiliation:
School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, Hubei, People’s Republic of China
Bin Shan*
Affiliation:
School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, Hubei, People’s Republic of China Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, TX 75080, U.S.A.
*
*Corresponding author: [email protected], [email protected]
*Corresponding author: [email protected], [email protected]
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Abstract

The transport properties of the atomic scale side contact between different metals (Au, Ag, Pt, Cu, Ni, Pd) and graphene with open zigzag ends have been studied from first-principles electron transport calculations. According to the contact configurations, we find the weakly interacting metals (Au, Ag, Pt and Cu) can form chemical bonds at the open graphene’s atomic edges, while the strongly interacting ones form chemical bonds in the whole contact region. Comparing with the case of end contact which could effectively decrease the contact resistance, the atomic scale side contact shows better transport properties than the end contact. And the graphene/metal side contact with hydrogen terminated graphene edge show obviously large resistance than the ones with open graphene edge, which signifies the importance of the termination of graphene edge in graphene/metal contact.

Keywords

Cmetalnanoscale
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1553: Symposium T – Electrical Contacts to Nanomaterials and Nanodevices , 2013 , mrss13-1553-t03-19
Copyright
Copyright © Materials Research Society 2013 

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