Hostname: page-component-cd9895bd7-dzt6s Total loading time: 0 Render date: 2024-12-27T18:20:41.715Z Has data issue: false hasContentIssue false

Electronic Structure of Deep-Lying Sulfur Centers in Si

Published online by Cambridge University Press:  28 February 2011

H. J. Zeiger
Affiliation:
Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, MA 02173–0073
W. H. Kleiner
Affiliation:
Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, MA 02173–0073
Get access

Abstract

A theoretical analysis has been made of infrared absorption spectra measured earlier for four deep-lying sulfur centers in Si. The data consist of absorption frequencies and polarization selection rules determined for uniaxial stress applied along [001], [111], and [110] axes. Both ls + np transitions and ls → ls transitions are observed. The A and B centers (binding energies 0.1090 eV and 0.1872 eV, respectively) are found to be He-like, while the C and D centers (binding energies 0.3683 eV and 0.6116 eV, respectively) are found to be He+-like. The D center spectra are consistent with Td symmetry, while the A, B and C spectra are consistent in most respects with C3v or D3d symmetry. One noteworthy result is the finding that the ls + np spectral frequencies observed under stress for the A center are consistent with a ls(E) ground state.

Type
Research Article
Copyright
Copyright © Materials Research Society 1985

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Krag, W. E., Kleiner, W. H., Zeiger, H. J., and Fischler, S., J. Phys. Soc. Jpn. 21 (Supp.), 230 (1966), DDC 646490; W. E. Krag, unpublished.Google Scholar
[21 See for example, Grimmeiss, H. G. and Janzen, E., in Proc. of MRS Symposium on Defects in Semiconductors II, Boston, Massachusetts (1982), Mahajan, S. and Corbet, J. W., Eds. (North Holland, New York, 1983), p. 33.Google Scholar
[3] A number of conflicting notations have been used in designating sulfur centers in Si. In comparing our results with those of other workers the only reliable procedure is to use binding energies as identifiers.Google Scholar
[4] Kohn, W., Solid State Physics, Vol. 5, Seitz, F. and Turnbull, D., Eds. (Academic Press, New York, 1957), p. 257.Google Scholar
[5] Brooks, H., Advances in Electronics and Electron Physics, Vol. 7, Marton, L., Ed. (Academic Press, New York, 1955), p. 85.Google Scholar
[6] See for example, Singh, V. A., Lindfelt, U., and Zunger, A., Phys. Rev. 27, 4909 (1983); J. Bernholc, N. O. Lipari, S. T. Pantelides, and M. Scheffler, in Proc. of International Conference on Defects in Semiconductors, Oisio, Japan (1980), R. R. Hasiguti, Ed. (IOP, London, 1981), p. 1.CrossRefGoogle Scholar
[7] Faulkner, R. A., Phys. Rev. 184, 713 (1969).CrossRefGoogle Scholar
[8] Ludwig, G. W., Phys. Rev. 137, A1520 (1965).CrossRefGoogle Scholar
[9] Brotherton, S. D., King, M. J., and Parker, G. J., J. Appl. Phys. 52, 4649 (1981).CrossRefGoogle Scholar
[10] Kravitz, L. and Paul, W., unpublished.Google Scholar