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Electronic Structure and Dynamics of Defect in a-Si:H by Ab-Initio Molecular Dynamics

Published online by Cambridge University Press:  01 January 1993

N. Orita
Affiliation:
Electrotechnical Laboratory, Tsukuba 305, Japan
T. Sasaki
Affiliation:
National Research Institute for Metals, Tokyo 153, Japan
H. Katayama–Yoshida
Affiliation:
Department of Physics, Tohoku University, Sendai 980, Japan
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Abstract

Electronic structure and dynamics of defects in hydrogenated amorphous silicon (a-Si:H) are investigated based upon ab–initio molecular–dynamics simulations. It is shown that (i) the hydrogen–passivated dangling bond (Si-H), (ii) the positively-ionized three–centered bond (Si– H+–Si), (iii) the negatively–ionized three–coordinated dangling bond (D) and (iv) the five- coordinated floating bond (F5) are the intrinsic defects in a–Si:H. Based upon the calculated result, we discuss the role of hydrogen and the origin of the photo–induced defect in a-Si:H.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

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References

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