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Electronic and Mechanical Properties of DC Sputtered Compositionally Modulated Metal Films

Published online by Cambridge University Press:  25 February 2011

J. S. Drewery  and
A. L. Greer
J. S. Drewery
Affiliation:
University of Cambridge, Department of Materials Science and Metallurgy, Pembroke Street, Cambridge CB2 3QZ, United Kingdom.
A. L. Greer
Affiliation:
University of Cambridge, Department of Materials Science and Metallurgy, Pembroke Street, Cambridge CB2 3QZ, United Kingdom.
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Abstract

We describe a recently constructed apparatus for the measurement of the Young's modulus and Poisson's ratio of free-standing sputtered multilayer films. In comparison with more conventional methods, this is expected to permit both measurement with lower uncertainties and interpretation which is more straightforward. A separate apparatus for the accurate measurement of the conductivity, magnetoresistance, and Hall coefficient of such systems has been prepared which will enable the contribution of Fermi surface-Brillouin zone interactions to the behaviour of these materials to be assessed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 103 , 1987 , 235
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCES

Cammarata, R.C., Ph.D. thesis, Harvard University (1985).Google Scholar
Baral, D., Ketterson, J.B. and Hilliard, J.E., J. Appl. Phys. 57, 1076 (1985).Google Scholar
Lee, P.A. and Ramakrishnan, T.V., Rev. Mod. Phys. 57, 287 (1985).Google Scholar
Friend, R.H. and Bett, N., J. Phys. E 19, 958 (1980).Google Scholar