Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-25T16:48:04.629Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron Energy Loss Fine Structure of Carbides and Nitrides

Published online by Cambridge University Press:  25 February 2011

Mark M. Disko
Mark M. Disko*
Affiliation:
Exxon Research and Engineering Company, Route 22 East, Annandale, NJ 08801
Get access

Abstract

Transition metal carbides and nitrides are important in a wide range of materials problems which include precipitates in high strength alloys and ceramic wear coatings. Electron energy loss spectroscopy (EELS) is a high spatial resolution (probe sizes < 100nm) analytical technique which is sensitive to variations in carbon or nitrogen stoichiometry. This sensitivity to light elements depends on the ability to relate the measured EELS spectrum to a material's electronic structure. The unique capabilities of EELS for the characterization of carbonitrides with high spatial resolution are discussed along with some of the experimental and analytical methods used to relate measured spectra to electronic structure. Data are presented for several members of the systems Ti-N-C and Cr-Fe-C.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 62: Symposium Q – Materials Problem Solving with the Transmission Electron Microscope , 1985 , 129
Copyright
Copyright © Materials Research Society 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Houghton, D. C., Weatherly, G. C. and Embury, J. D., Thermomechanical Processing of Microalloyed Austenite, edited by DeArdo, A. J., Ratz, G. A. and Wray, P. J. (Am. Inst. of Mining, Metallurgical and Petroleum Engineering, New York, 1982), p. 267.Google Scholar
2. Pflüger, J., Fink, J., Weber, W. and Bohnem, K. -P., Phys. Rev. B30, 1155 (1984).CrossRefGoogle Scholar
3. Teyssandier, F., Ducarroir, M. and Bernard, C., CALPHAD 8, 233 (1984).CrossRefGoogle Scholar
4. Wyckoff, W. G., Crystal Structures, Vol.1(Wyley, Interscience, NY, 1964), p. 94.Google Scholar
5. Daniels, J., Festenberg, C., Raether, H., and Zeppenfeld, Z., Springer Tracts in Modern Physics 54 (Springer, New York, 1970), p. 77.CrossRefGoogle Scholar
6. Raether, H., Springer Tracts in Modern Physics 88, (Springer, Berlin, 1980).Google Scholar
7. Egerton, R. F., Scanning Electron Microscopy/1984 Vol. 2, edited by Johari, O. (SEM Inc., AMF O'Hare, Illinois), p. 505.Google Scholar
8. Leapman, R. D., Grunes, L. A., Fejes, P. L. and Silcox, J., Phys. Rev. B26, 614 (1982).CrossRefGoogle Scholar
9. Colliex, C., Scanning Electron Microscopy/1985 Vol. 2, edited by Johari, O. (SEM Inc., AMF O'Hare, Illinois) p. 489.Google Scholar
10. Leapman, R. D., Grunes, L. A., Fejes, P. L. and Silcox, J., EXAFS Spectroscopy, edited by Teo, B. K. and Joy, O. C. (Plenum, New York 1981), p. 217.CrossRefGoogle Scholar
11. Taftø, J. and Krivanek, O. L., Phys. Rev. Lett. 48, 560 (1982).CrossRefGoogle Scholar
12. Allen, S. M., Phil. Mag. A43, 325 (1981).CrossRefGoogle Scholar
13. Leapman, R. D., Fiori, C. E. and Swyt, C. R., J. Microscopy 133, 239 (1984).CrossRefGoogle Scholar
14. Egerton, R. F., Williams, B. G. and Sparrow, T. G., Proc. Royal Soc. Lond. A398, 395 (1985).Google Scholar
15. Thomas, L., Analytical Electron Microscopy – 1984, edited by Williams, D. B. and Joy, D. C. (San Francisco Press, 1984), p. 358.Google Scholar
16. Shuman, H. and Kruit, Pieter, Rev. Sci. Instrum. 56, 231 (1985).CrossRefGoogle Scholar
17. Leapman, R. D., Fejes, P. L., and Silcox, J., Phys. Rev. B28, 2361 (1983).CrossRefGoogle Scholar
18. Craven, A. J. and Buggy, T. W., J. Microscopy 136, 227 (1984).CrossRefGoogle Scholar
19. Otani, S., Tanaka, T. and Ishizawa, Y., J. Cryst. Growth 71, 615 (1985).CrossRefGoogle Scholar
20. Eizenberg, M. and Murarka, S. P., J. Appl. Phys. 54, 3190 (1983).CrossRefGoogle Scholar
21. Pflüger, J., Fink, J., Crecelius, G., Bohnem, K. P. and Winter, H., Sol. St. Comm. 44, 489 (1982).CrossRefGoogle Scholar
22. Goldschmidt, H. J., J. Iron and Steel Inst. 160, 345 (1948).Google Scholar
23. Raghavan, M., Mueller, R. R., Klein, C. F. and Vaughn, G. A., Scripta Metall. 17, 1189 (1983).CrossRefGoogle Scholar