Hostname: page-component-cd9895bd7-fscjk Total loading time: 0 Render date: 2024-12-27T02:38:43.389Z Has data issue: false hasContentIssue false

Electron Emission Mechanism of Doped CVD Diamond Characterized Using Combined XPS/UPS/FES System

Published online by Cambridge University Press:  01 February 2011

Hisato Yamaguchi
Affiliation:
[email protected], Japan Advanced Institute of Science and Technology, School of Materials science, 1-1 Asashidai, Nomi, 923-1292, Japan
Ichitaro Saito
Affiliation:
[email protected], University of Cambridge, Department of Engineering, 9, JJ Thompson Avenue, Cambridge, CB3 0FA, United Kingdom
Yuki Kudo
Affiliation:
[email protected], International Christian University, Department of Physics, 3-10-2 Osawa, Mitaka, Tokyo, 181-8585, Japan
Tomoaki Masuzawa
Affiliation:
[email protected], International Christian University, Department of Physics, 3-10-2 Osawa, Mitaka, Tokyo, 181-8585, Japan
Takatoshi Yamada
Affiliation:
[email protected], AIST, Diamond Research Center, 1-1-1 Umezono, Tsukuba, 305-8568, Japan
Masato Kudo
Affiliation:
[email protected], JEOL, Technical Division 1, 3-1-2 Musashino, Akishima, Tokyo, 196-8558, Japan
Yuji Takakuwa
Affiliation:
[email protected], Tohoku University, IMRAM, 2-1-1 Katahira, Aoba, Sendai, 980-8577, Japan
Ken Okano
Affiliation:
[email protected], International Christian University, Department of Physics, 3-10-2 Osawa, Mitaka, Tokyo, 181-8585, Japan
Get access

Abstract

Electric field of less than 5 V/μm is enough to extract electrons from diamond, whereas field of one to two orders of magnitude higher is needed to extract electrons from metal emitter tips. Despite such low-threshold field, the difficulty in clarification of electron emission mechanism is the factor preventing diamond from being used in a practical use. Quite a few numbers of possible mechanisms were proposed to better understand the origin and properties of the observed emission. Most of these mechanisms were, however, based on the conventional I (Emission current)-V (Anode voltage) characteristics. Energy distribution of the field-emitted electrons is essential in direct clarification of the mechanism. In this study, combined XPS/UPS/FES system was used to characterize the electron emission mechanism of doped chemical vapor deposited (CVD) diamond. The results indicated successful observation of the origin of field-emitted electrons from doped CVD diamond comparison with natural diamond, used as a reference.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Okano, K., Koizumi, S., Silva, S. R. P., and Amaratunga, G. A. J., Nature (London) 381, 140 (1996).Google Scholar
[2] Huang, Z. H., Cutler, P. H., Miskovsky, N. M., Sullivan, T. E., Appl. Phys. Lett. 65, 2562 (1994).Google Scholar
[3] Geis, M. W., Twichell, J. C., Efremow, N. N., Krohn, K., and Lyszczars, T. M., Appl. Phys. Lett. 68, 2294 (1996).Google Scholar
[4] Okano, K., Yamada, T., Sawabe, A., Koizumi, S., Itoh, J., and Amaratunga, G. A. J., Appl. Phys. Lett. 79, 275 (2001).Google Scholar
[5] Diederich, L., Kuttel, O. M., Aebi, P., and Schlapbach, L., Surf. Sci. 418, 219 (1998).Google Scholar
[6] Bandis, C., and Pate, B. B., Appl. Phys. Lett. 69, 366 (1996).Google Scholar
[7] Okano, K., Yamada, T., Ishihara, H., Koizumi, S., Itoh, J., Appl. Phys. Lett. 70, 2201 (1997).Google Scholar
[8] Geis, M. W., Twichell, J. C., Macaulay, J., and Okano, K., Appl. Phys. Lett. 67, 1328 (1995).Google Scholar
[9] Yamada, T., Ishihara, H., Okano, K., Koizumi, S., Itoh, J., J. Vac. Sci. Technol. B 15, 1678 (1997).Google Scholar
[10] Yamaguchi, H., Mine, T., Suzuki, Y., Yamada, T., Sawabe, A., and Okano, K., J. Vac. Sci. Technol. B, 21, 1730 (2003).Google Scholar
[11] Himpsel, F. J., Knapp, J. A., Van Vechten, J. A., Eastman, D. E., Phys. Rev. B 20, 624 (1979).Google Scholar
[12] Pate, B. B., Surf. Sci. 165, 83 (1986).Google Scholar
[13] Takeuchi, D., Kato, H., Ri, G. S., Yamada, T., Vinod, P. R., Hwang, D., Nebel, C. E., Okushi, H, and Yamazaki, S., Appl. Phys. Lett. 86, 152103 (2005).Google Scholar
[14] Cui, J. B., Ristein, J., and Ley, L., Phys. Rev. B 60, 16135 (1999).Google Scholar
[15] Farrer, R. G., Solid State Commun. 7, 685 (1969).Google Scholar