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Electron Diffuse Scattering Characterization of Perovskite Thin Films

Published online by Cambridge University Press:  01 February 2011

Jerome Pacaud  and
Frederic Pailloux
Jerome Pacaud
Affiliation:
[email protected], University of Poitiers, Lab de Metallurgie Physique, SP2MI/BP30179, Ave P et M Curie, Chasseneuil, 86962, France, Metropolitan
Frederic Pailloux
Affiliation:
[email protected], University of Poitiers, Lab de Metallurgie Physique, SP2MI/BP30179, Ave P et M Curie, Chasseneuil, 86962, France, Metropolitan
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Abstract

For perfect crystal, diffuse scattering is mostly inelastic due to phonons, plasmons and other processes. Thermal diffuse scattering or phonon scattering can lead to large effects in the electron diffraction pattern especially near second order phase transition where phonon softening occurs. Additionally, elastic diffuse scattering comes from structural deviations from a periodic lattice. These structural deviations can be defects, partial ordering of otherwise disordered structure or structural fluctuations. By studying diffuse scattering we can obtain information about the crystal imperfections and dynamics which can not be obtained from other characterization methods.

Keywords

thin filmtransmission electron microscopy (TEM)phase transformation
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1026: Symposium C – Quantitative Electron Microscopy for Materials Science , 2007 , 1026-C11-04
Copyright
Copyright © Materials Research Society 2008

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