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Electron carrier concentration dependent magnetization in ZnO:Co and ZnO:Mn thin films

Published online by Cambridge University Press:  01 February 2011

Zheng Yang
Affiliation:
[email protected], University of California at Riverside, Department of Electrical Egineering, 900 University Avenue (Bourns Hall B144), Riverside, CA, 92521, United States, 951-827-7723, 951-827-2425
Maurizio Biasini
Affiliation:
[email protected], University of California at Riverside, Department of Physics and Astronomy, Riverside, CA, 92521, United States
Leelaprasanna J Mandalapu
Affiliation:
[email protected], University of California at Riverside, Quantum Structures Laboratory, Department of Electrical Egineering, Riverside, CA, 92521, United States
Zheng Zuo
Affiliation:
[email protected], University of California at Riverside, Quantum Structures Laboratory, Department of Electrical Egineering, Riverside, CA, 92521, United States
Ward P Beyermann
Affiliation:
[email protected], University of California at Riverside, Department of Physics and Astronomy, Riverside, CA, 92521, United States
Jianlin Liu
Affiliation:
[email protected], University of California at Riverside, Quantum Structures Laboratory, Department of Electrical Egineering, Riverside, CA, 92521, United States
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Abstract

Co and Mn ions were implanted into n-type ZnO thin films with different electron carrier concentrations. X-ray diffraction measurements show that the ZnO:Co and ZnO:Mn thin films are of high crystallinity. From magnetization measurements, ferromagnetism was observed in both n-type ZnO:Co and n-type ZnO:Mn thin films with Curie temperatures well-above room temperature. Furthermore, the electron carrier concentration dependence of the saturated magnetization was measured in both types of thin films, and our results support an electron-mediated mechanism for ferromagnetism in ZnO:Co, as predicted by theory. However, our measurements seem to contradict theory for ZnO:Mn, which only predicts long-range ferromagnetism for p-type mediated material.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

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