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Electron Beam Effects during In-Situ Annealing of Self-Ion Irradiated Nanocrystalline Nickel

Published online by Cambridge University Press:  19 May 2015

Brittany Muntifering ,
Rémi Dingreville ,
Khalid Hattar  and
Jianmin Qu
Brittany Muntifering
Affiliation:
Northwestern University, Evanston, IL, USA Sandia National Laboratories, Albuquerque, NM, USA
Rémi Dingreville
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA
Khalid Hattar
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA
Jianmin Qu
Affiliation:
Northwestern University, Evanston, IL, USA
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Abstract

Transmission electron microscopy (TEM) is a valuable methodology for investigating radiation-induced microstructural changes and elucidating the underlying mechanisms involved in the aging and degradation of nuclear reactor materials. However, the use of electrons for imaging may result in several inadvertent effects that can potentially change the microstructure and mechanisms active in the material being investigated. In this study, in situ TEM characterization is performed on nanocrystalline nickel samples under self-ion irradiation and post irradiation annealing. During annealing, voids are formed around 200 °C only in the area illuminated by the electron beam. Based on diffraction patterns analyses, it is hypothesized that the electron beam enhanced the growth of a NiO layer resulting in a decrease of vacancy mobility during annealing. The electron beam used to investigate self-ion irradiation ultimately significantly affected the type of defects formed and the final defect microstructure.

Keywords

defectsradiation effectstransmission electron microscopy (TEM)
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1809: Symposium XX – Multiscale Modeling and Experiments on Microstructural Evolution in Nuclear Materials , 2015 , pp. 13 - 18
Copyright
Copyright © Materials Research Society 2015 

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