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Electromagnetic Acoustic Resonance To Assess Creep Damage In 2.25Cr-lMo Steel

Published online by Cambridge University Press:  10 February 2011

M. Hirao
Affiliation:
Graduate School of Engineering Science, Osaka University, Toyonaka, Osaka 560, Japan, [email protected], [email protected]
H. Ogi
Affiliation:
Graduate School of Engineering Science, Osaka University, Toyonaka, Osaka 560, Japan, [email protected], [email protected]
T. Ohtani
Affiliation:
Ebara Research Co. LTD. Fujisawa, Kanagawa 251, Japan, [email protected]
T. Morishita
Affiliation:
Depertment of Mechanical Engineering, Akashi College of Technology, Akashi, Hyogo, Japan, [email protected]
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Abstract

Method of electromagnetic acoustic resonance (EMAR) was applied to the noncontact measurement of the shear wave attenuation during the creep test of 2.25Cr-1Mo steels. Two electromagnetic acoustic transducers were manufactured for this purpose, which generate the polarized shear waves through the magnetostriction effect. The attenuation coefficient increased with the creep deformation. The evolution range of the attenuation was beyond 0.1 μs−1 before the failure, which was much larger than the attenuation variation among the samples.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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References

REFERENCES

1. Ogi, H., J. Appl. Phys. 82, 3940 (1997).Google Scholar
2. Johnson, W. L., Auld, B. A., and Alers, G. A., Review of Progres in QNDE, Vol.13, eds. Thompson, D. O. and Chimenti, D. E. (Plenum, New York, 1994), p. 16031610.Google Scholar
3. Ogi, H., Hirao, M., and Minoura, K., J. Appl. Phys. 81, 3677 (1997).Google Scholar
4. Hirao, M., Ogi, H., and Fukuoka, H., Rev. Sci. Instrum., 64, 3198 (1993).Google Scholar
5. Peteresen, G.L., Chick, B.B., Fortunko, C.M., and Hirao, M., Rev. Sci. Instrum., 65, 192 (199).Google Scholar
6. Goebbels, K., Res. Tech. in NDT, Vol.4, ed. Sharpe, R. S. (Academic Press, London, 1980), p. 87.Google Scholar
7. Granato, A. and Lücke, K., J. Appl. Phys. 27, 583 (1956).Google Scholar
8. Ogi, H., Suzuki, N., and Hirao, M., 1997-IEEE Inter. Ultra. Symp., October 5–8, Toronto, Canada, in press.Google Scholar