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Electrodeposited Metallic Nanowires as a Scanning Probe Tip
Published online by Cambridge University Press: 31 January 2011
Abstract
This paper describes lateral deformations of electrodeposited Ni nanowires as an atomic force microscope (AFM) probe tip. The maximum end deflections for nanowires to break the elasticity, which beam mechanics indicates, were applicable to our observed results.
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- Copyright © Materials Research Society 2010