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Electrically Based Non-Destructive Microstructural Characterization of All Classes of Materials

Published online by Cambridge University Press:  10 February 2011

Rosario A. Gerhardt
Rosario A. Gerhardt*
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0245, [email protected]
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Abstract

This paper gives a short summary of the background, theory and methodology needed to utilize electrical measurements as a non-destructive method for microstructural characterization. Examples are given for all classes of materials. Details are given for how to detect: (1) pore volume in thermal barrier coatings, (2) formation of surface layers due to moisture adsorption in a wide variety of materials, (3) orientation of fibers and whiskers in ceramic matrix and polymer matrix composites, (4) crack detection in metals and (5 ) stacking faults in semiconductors. Many other examples are mentioned. It needs to be emphasized that electrical measurements alone are not sufficient to identify the microstructural features of interest but must always be accompanied by complementary techniques. Proper data collection and data interpretation of properties of a specific set of materials can lead to in-line process monitoring, quality control monitoring, mechanical damage monitoring and environmental degradation monitoring of those materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 591 , 1999 , 93
Copyright
Copyright © Materials Research Society 2000

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References

REFERENCES

1.Gerhardt, R.A., Taylor, S.R. and Garboczi, E.J., eds., Electrically Based Microstructural Characterization, Mat. Res. Symp. Proc. Vol. 411, 435 pages (1996).Google Scholar
2.Gerhardt, R.A., Alim, M.A. and Taylor, S.R., eds., Electrically Based Microstructural Characterization II, Mat. Res. Symp. Proc. Vol. 500, 367 pages (1998).Google Scholar
3.von Hippel, A.R., Dielectrics and Waves, John Wiley & Sons, 1954.Google Scholar
4.Duchow, K.J. and Gerhardt, R.A., “Dielectric Characterization of Wood and Wood Infiltrated with Ceramic Precursors,” Mat.Sc.Eng. C4, 125–131 (1996).Google Scholar
5.Gerhardt, R., “Dielectric and Impedance Spectroscopy Revisited: Distinguishing Localized Relaxation from Long Range Conductivity,” J.Phys. Chem.Solids 55[12], 1491–1506 (1994).Google Scholar
6.Macdonald, J. Ross, ed., Impedance Spectroscopy: Emphasizing Solid Materials and Systems, John Wiley & Sons, 1987.Google Scholar
7.Sillars, R.W., “The properties of a Dielectric containing Semiconducting Particles of Various Shapes,” J. Inst.Elect.Engrs. 80, 378–394 (1937).Google Scholar
8.Hilfer, R., “Geometric and Dielectric Characterization of Porous Media,” Phys.Rev. B 44, 60–85(1991).Google Scholar
9.Kingery, W.D., Bowen, H.K. and Uhlmann, D.R., Introduction to Ceramics, 2ed edition, John Wiley and Sons. 1976.Google Scholar
10.Gerhardt, R., “Composites for Electronic Substrate Applications,” Mat.Res.Symp.Proc. 108, 101–106 (1988).Google Scholar
11.McLachlan, D.S., Blaszkiewicz, M. and Newnham, R.E., “Electrical Resistivity of Composites,” J Am. Ceram.Soc. 73[8], 2187(1990).Google Scholar
12.Kokan, J.R., Gerhardt, R.A., Ruh, R. and McLachlan, D.S., “Dielectric Spectroscopy of Insulator-Conductor Mixtures,” Mat. Res. Symp. Proc. 500, 341–346 (1998).Google Scholar
13.Runyan-Kokan, J., Gerhardt, R.A. and Ruh, R., “Electrical Properties of BN Matrix Composites: Part I” J. Am. Ceram. Soc., in press.Google Scholar
14.Gerhardt, R. and Grossman, T.R., “Characterization of Porosity in Thermal Barrier Coatings,” Ceram. Trans. Vol. 11, 189–200(1990).Google Scholar
15.Ciccarelli, S., Gerhardt, R.A. and Grossman, T.R., “Electrical Property-Porosity Relationships in Plasma Sprayed Coatings,” unpublished results.Google Scholar
16.Cochran, J.K., Chu, P.R., Huang, T.J., “Thin wall hollow spheres from slurries,” US DOE presentation, 1992 and Torobin, L.B., U.S. Patent 4,671,909, June 1987.Google Scholar
17.Dinkins, W.R., Gerhardt, R.A. and Cochran, J.K. Jr., unpublished results.Google Scholar
18.Dinkins, W.R., M.S. Thesis, Georgia Institute of Technology, 1994.Google Scholar
19.Cao, W., Gerhardt, R. and Wachtman, J.B. Jr., “Dielectric relaxation of water adsorbed on monolithic porous silica gels,” Ceram. Trans. vol. 8, 175–184 (1990).Google Scholar
20.Kokan, J.R. and Gerhardt, R.A., “Humidity Effects on Porous Silica Thin Films,” Mat.Res.Symp.Proc. 411, 419–424 (1996).Google Scholar
21.Duchow, K. J., M.S. Thesis, Georgia Institute of Technology, 1996.Google Scholar
22.Bulinski, A.J., Damji, S. and Das-Gupta, D.K., “Effect of Moisture on Polyimide materials,” IEEE Proc. CEIDP, 600–603 (1996).Google Scholar
23.Kokan, J.R., Zhang, G. and Gerhardt, R.A., “Porous Silica in Bulk and Thin Film Form for Use in Humidity Sensing Applications,” Proc. 6th Intl. Workshop on Moisture in Microelectronics, 1996.Google Scholar
24.Gerhardt, R.A. and Cao, W., “Distinguishing bulk water from adsorbed water via dielectric measurements,” IEEE Proc. CEIDP, 102–105 (1996).Google Scholar
25.Ruh, R., Donaldson, K. and Hasselman, D.P.H., “Thermal Conductivity of Boron Carbide-Boron Nitride Composites,” J Am. Ceram.Soc. 75[10],2887–2890(1992).Google Scholar
26.Sbaizero, O. and Evans, A.G., “Tensile and Shear Properties of Laminated Ceramic Matrix Composites,” J.Am.Ceram.Soc. 69[6], 481–492 (1986).Google Scholar
27.Gerhardt, R., “Microstructural Characterization of Composites via Electrical Measurements,” Ceram.Eng.Sc.Proc. 15[5], 1174–1181 (1994).Google Scholar
28.Gerhardt, R., Yang, F. and Saxena, A., unpublished results.Google Scholar
29.Gerhardt, R. and Ruh, R., “Electrical Properties of SiC Whisker Reinforced Mullite Composites: I. Volume fraction and whisker orientation dependence,” J.Mat.Sc., in press.Google Scholar
30.Runyan-Kokan, J., Gerhardt, R.A. and Ruh, R., “Electrical Properties of BN Matrix Composites III” J. Am. Ceram. Soc., in press.Google Scholar
31.Gerhardt, R., Phillips, K.C. and Logan, K.V., unpublished results.Google Scholar
32.Brosseau, C., Bourbigot, C., Queffelec, P., LeMest, Y., Loaec, J. and Beroual, A., “Dielectric and Microstructural Properties of Polymer-Carbon Black Composites,” Proc. IEEE CEIDP, 208–211 (1996).Google Scholar
33.Gerhardt, R. and McLachlan, D.S., “Frequency Behavior of Percolating Systems,” J.Phys.Chem.Solids, in press.Google Scholar
34.Runyan-Kokan, J., Gerhardt, R.A. and Ruh, R., “Electrical Properties of Boron Carbide-Boron Nitride Composites: Observations Near Percolation Threshold,” J.Am.Ceram.Soc., in press.Google Scholar
35.Cretegny, L.C., Gerhardt, R.A. and Saxena, A., unpublished results.Google Scholar
36.Kokan, J. R., Gerhardt, R.A. and Su, Ching-Hua, “Dielectric Spectroscopy Study of ZnSe Grown by Physical Vapor Transport,” Mat.Res.Symp.Proc. 487, 517–522(1998).Google Scholar