Hostname: page-component-5c6d5d7d68-7tdvq Total loading time: 0 Render date: 2024-08-27T16:35:49.958Z Has data issue: false hasContentIssue false

Electrical Properties of Solid Phase Crystallized Silicon Films

Published online by Cambridge University Press:  17 March 2011

Tadashi Watanabe
Affiliation:
Tokyo University of Agriculture and Technology, 2-24-16 Nakacho, Koganei, Tokyo 184-8588, Japan
Hajime Watakabe
Affiliation:
Tokyo University of Agriculture and Technology, 2-24-16 Nakacho, Koganei, Tokyo 184-8588, Japan
Toshiyuki Sameshima
Affiliation:
Tokyo University of Agriculture and Technology, 2-24-16 Nakacho, Koganei, Tokyo 184-8588, Japan
Get access

Abstract

In this study, the carrier mobility and density for solid phase crystallized (SPC) silicon films fabricated at 600 °C for 48 hours are analyzed by free carrier optical absorption. The carrier mobility is 40 cm2/Vs for SPC films doped with 6×1019-cm−3-phosphorus atoms. This analysis suggests the SPC films have fine crystalline grains closed to single crystalline silicon. In addition, initial carrier density was 3×1019 cm−3, which increased to 6×1019 cm−3by XeCl excimer laser irradiation of 500mJ/cm2. The inactivated regions in SPC films are reduced by laser irradiation. However, the electrical conductivity after laser irradiation for SPC films doped with 6×1018-cm−3-phosphorus atoms decreased from 3.3 to 0.018 S/cm as laser energy density increased to 500mJ/cm2. On the other hand, the electrical conductivity increased from 14.7 to 31.3 S/cm with similar increase of laser energy density after H2O vapor heat treatment at 260°C for 3 hours with 1.3 MPa. Furthermore, the characteristics of n-channel TFTs fabricated with initial SPC films as well as SPC films which was irradiated by laser at 425mJ/cm2 are also researched. The threshold voltage is decreased from 3.8 to 2.0 V by laser irradiation. Threshold voltages of both cases are decreased from 3.8 to 2.4 V for no-laser irradiation and from 2.0 to 0.8 V for laser irradiation, after H2O vapor heat treatment at 310°C for 1 hour with 9.0MPa. Based on the above trial, the defect reduction method combining laser irradiation and H2O vapor heat treatment has proved to be very effective for SPC films and SPC TFTs.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Hong, C.H. and Park, C.Y., J.Appl.Phys. 71 (1992) 5427.Google Scholar
2. Kim, J.K. and Lee, J.Y., Nam, K.S., J. Appl. Phys. 77 (1995).Google Scholar
3. Little, T.W., Takahara, K., Koike, H., Nakazawa, T., Yudasaka, I. and Ohshima, H., Jpn. J. Appl. Phys. 30 (1991) pp.37243728.Google Scholar
4. Engstrom, H., J. Appl. Phys. 51 (1980) 5245.Google Scholar
5. Born, M. and Wolf, E.: principles of Optics (Pergamon, New York, 1974) Chap. 1 and 13.Google Scholar
6. Sameshima, T., Saitoh, K., Aoyama, N., Higashi, S., Kondo, M. and Matsuda, A., Jpn. J. Appl. Phys. 38 (1999) 1892.Google Scholar
7. Sameshima, T., Saitoh, K., Sato, M., Tajima, A. and Takashima, N., Jpn. J. Appl. Phys. Lett. 36 (1997) L136063.Google Scholar
8. Sameshima, T., Mat. Res.Soc.Symp.Proc.Vol.536 (1999) 427438.Google Scholar
9. Sameshima, T., Saito, K., Aoyama, N., Tanda, M., Kondo, M., Matsuda, A. and Higashi, S.: Technical Digfest of the Int. Photovoltaic Solar Energy Conf. (Sapporo, Japan,1999) p211.Google Scholar
10. Kamiya, T., Nakahata, T., Sameshima, T., Watanabe, T. and Mohri, T., J. Appl. Phys. 88 (2000) 3310.Google Scholar
11. Higashi, S., Ozaki, K., Sakamoto, K., Kano, Y. and Sameshima, T., Jpn. J. Appl. Phys. 38 (1999) L857–L860.10.1143/JJAP.38.L857Google Scholar
12. Asada, K., Sakamoto, K., Watanabe, T., Sameshima, T. and Higashi, S., Jpn.J.Appl.Phys. 39 (2000) pp.38823887.Google Scholar
13. Sameshima, T., Satoh, M., Sakamoto, K., Hisamatsu, A. and Ozaki, K., Jpn.J.Appl.Phys. 37 (1998) pp.L112–L114.Google Scholar
14. Sameshima, T., Satoh, M., Sakamoto, K., Ozaki, K. and Saitoh, K., Jpn.J.Appl.Phys. 37 (1998) pp.42544257.Google Scholar