Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-25T15:16:39.878Z Has data issue: false hasContentIssue false

Electrical and Photonic Functions in Transparent Oxide Semiconductors: Utilization of Built-in Nanostructure

Published online by Cambridge University Press:  01 February 2011

Hideo Hosono*
Affiliation:
Matenals and Structures Laboratory, Tokyo Institute of Technology, Nagatsuta 4259, Midon-ku, Yokohama 226–8503, JAPAN Transparent Electro-Active Matenals Project, Exploratory Research for Advanced Technology, (ERATO), Japan Science and Technology Agency, KSP-C1232, Sakato3–2-l, Takatsu-ku, Kawasaki 213–0012, JAPAN
Get access

Abstract

We review distinct photonic/electronic properties onginating from built-in nano-structures in transparent oxide based matenals, emphasizing potential of nanostructures hidden in crystal structure. Matenals focused are oxychalcogenides LaCuOCh (Ch=chalcogen ion) and homologous oxides InGaO3(ZnO)m(m=integer) having naturally formed multi-quantum well structures. Novel functions and devices ansing from the built-in nanostructure are: (1) modulation doping of positive holes and room temperature stable exciton in LaCuOCh, (2) high performance transparent field-effect transistor fabncated in InGaO3(ZnO)5 epitaxial thin films, and (3) conversion of insulator to persistent electronic conductor by carner doping in 12CaO 7A12O3 (C12A7).

Type
Research Article
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Hosono, H., Ohta, H., Orita, M., Ueda, K., and Hirano, M., Vacuum, 66, 419 (2002).Google Scholar
2 Hosono, H., Ikuta, Y., Kinoshita, T., Kajihara, K., and Hirano, M., Phys. Rev. Lett. 87, 175501 (2001);Google Scholar
Oto, M., Kikugawa, S., Sarukura, N., Hirano, M., and Hosono, H., IEEE Photon. Technol. Lett. 13, 978 (2001).Google Scholar
3 Kawamura, K., Ito, N., Sarukura, N., Hirano, M., and Hosono, H.,” Rev. Sci. Instr. 73, 1711 (2002);Google Scholar
Kawamura, K., Kamiya, T., Hirano, M., and Hosono, H., Appl. Phys. Lett. 81, 1137 (2002).Google Scholar
4 Ueda, K., and Hosono, H., J. Appl. Phys. 91, 4768 (2002).Google Scholar
5 Ueda, K., Inoue, S., Hirose, S., Kawazoe, H., and Hosono, H.,” Appl. Phys. Lett., 77, 2701 (2000).Google Scholar
6 Ueda, K., Takafuji, K., Hiramatsu, H., Ohta, H., Kamiya, T., Hirano, M., and Hosono, H., Chem. Mater. 15, 36923695 (2003).Google Scholar
7 Kawazoe, H., Yasukawa, N., Hyodo, H., Kurita, M., Yanagi, H., and Hosono, H., Nature 389, 939 (1997).Google Scholar
8 Zhu, W. J., Huang, Y. Z., Dong, C., and Zhao, Z. X., Mater. Res. Bull. 29, 143147 (1994).Google Scholar
9 Charkin, D. O., Akopyan, A. V., and Dolgikh, V. A., Russ. J. Inorg. Chem. 44, 833837 (1999).Google Scholar
10 Ueda, K., Hiramatsu, H., Ohta, H., Hirano, M., Kamiya, T., and Hosono, H., Phys. Rev. B, accepted for publicationGoogle Scholar
11 Hiramatsu, H., Ueda, K., Ohta, H., Hirano, M., Kamiya, T., and Hosono, H., Appl. Phys. Lett. 82, 1048 (2003).Google Scholar
12 Hiramatsu, H., Ueda, K., Ohta, H., Hirano, M., Kamiya, T., and Hosono, H., Thin Solid Films (in press).Google Scholar
13 Hiramatsu, H., Ueda, K., Takafuji, K., Ohta, H., Hirano, M., Kamiya, T., and Hosono, H., J. Appl. Phys. 94, 5805 (2003).Google Scholar
14 Ueda, K., Inoue, S., Hosono, H., Sarukura, N., and Hirano, M., Appl. Phys. Lett. 78, 2333 (2001).Google Scholar
15 Li, Y., Tanaka, M., and Nakamura, A., Phys. Rev. B57, 9193 (1998).Google Scholar
16 Chemla, D. S. and Miller, D. A. B., J. Opt. Soc. Am. B2, 1155 (1985).Google Scholar
17 Sutherland, R. L., Handbook of Nonlinear Optics, Marcel Dekker, NewYork, 1996.Google Scholar
18 Kamioka, H., Hiramatsu, H., Ohta, H., Hirano, M., Ueda, K., Kamiya, T., and Hosono, H., Appl. Phys. Lett. accepted for publication.Google Scholar
19 Ohta, H., Nomura, K., Orita, M., Hirano, M., Ueda, K., Suzuki, T., Ikuhara, Y., and Hosono, H., Adv. Funct. Mater. 13, 139 (2003).Google Scholar
20 Nomura, K., Ohta, H., Ueda, K., Kamiya, T., Hirano, M., and Hosono, H., Science, 300, 1269 (2003).Google Scholar
21 Hayashi, K., Matsuishi, S., Kamiya, T., Hirano, M., and Hosono, H., Nature 419, 462(2002).Google Scholar
22 Bartl, H., and Scheller, T., N. Jb. Miner. Mh. 35, 547 (1970).Google Scholar
23 Imlach, J. A., Glasser, L. S. D., and Glasser, F. P., Cement Conc. Res. 1, 57 (1971).Google Scholar
24 Jeevaratnam, J., Glasser, F. P., and Glasser, L. S. D., J. Am. Ceram. Soc. 47, 105–6 (1964).Google Scholar
25 Hosono, H., and Abe, Y., “Inorg. Chem. 26, 1192 (1987).Google Scholar
26 Hayashi, K., Hirano, M., Matsuishi, S., and Hosono, H., J. Am. Chem. Soc. 124, 738 (2002).Google Scholar
27 Sushko, P. V., Shulger, A. L., Hayashi, K., Hirano, M., and Hosono, H., Phys. Rev. Lett. 91, 126401 (2003).Google Scholar