Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Choo, Woong Kil
Kim, Kwang Young
Kim, Hyo Jin
and
Kim, Sung Tae
1992.
Microstructural Rearrangement in PZT(52/48) Thin Film Prepared By Reactive Cosputtering on Pt on Si(100).
MRS Proceedings,
Vol. 280,
Issue. ,
Leuchtner, R. E.
Grabowski, K. S.
Chrisey, D. B.
and
Horwitz, J. S.
1992.
Filament-assisted pulsed laser deposition of epitaxial PbZrxTi1−xO3films: Morphological and electrical characterization.
Integrated Ferroelectrics,
Vol. 1,
Issue. 2-4,
p.
223.
Lefki, K.
and
Dormans, G. J. M.
1994.
Measurement of piezoelectric coefficients of ferroelectric thin films.
Journal of Applied Physics,
Vol. 76,
Issue. 3,
p.
1764.
Chang, L.H.
and
Anderson, W.A.
1996.
Multilayer Lead Zirconate Titanate and Barium Titanate Ferroelectric Capacitors.
MRS Proceedings,
Vol. 433,
Issue. ,
Kholkin, A. L.
Wütchrich, Ch.
Taylor, D. V.
and
Setter, N.
1996.
Interferometric measurements of electric field-induced displacements in piezoelectric thin films.
Review of Scientific Instruments,
Vol. 67,
Issue. 5,
p.
1935.
Jaber, B.
Velu, G.
Cattan, E.
Tronc, P.
Remiens, D.
and
Thierry, B.
1997.
Influence of the processing parameters on the piezoelectric properties of sputtered lead-based ferroelectric thin films.
Integrated Ferroelectrics,
Vol. 17,
Issue. 1-4,
p.
329.
Dong-Guk Kim
and
Ho-Gi Kim
1998.
A new characterization of piezoelectric thin films.
p.
65.
Cattan, E.
Jaber, B.
Tronc, P.
Remiens, D.
and
Thierry, B.
1998.
Piezoelectric properties of sputtered PbTiO3 films: Growth temperature and poling treatment effects.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films,
Vol. 16,
Issue. 1,
p.
169.
Cattan, E.
Haccart, T.
and
Rémiens, D.
1999.
e
31
piezoelectric constant measurement of lead zirconate titanate thin films.
Journal of Applied Physics,
Vol. 86,
Issue. 12,
p.
7017.
Kim, Dong-Guk
and
Kim, Ho-Gi
1999.
Piezoelectric properties of lead zirconate titanate thin films characterized by the pneumatic loading method.
Integrated Ferroelectrics,
Vol. 24,
Issue. 1-4,
p.
107.
Kim, Dong-Guk
Kim, Il-Doo
Lee, Chi-Heon
Park, Jeong-Ho
and
Kim, Ho-Gi
2001.
The effect of processing parameter on the piezoelectric d-coefficients of PZT thin films.
Ferroelectrics,
Vol. 263,
Issue. 1,
p.
27.
Kim, Dong-Guk
Kim, Il-Doo
Lee, Chi-Heon
Park, Jeong-Ho
Choi, Kwang-Pyo
and
Kim, Ho-Gi
2001.
Evaluation method of longitudinal and transverse piezoelectric d-coefficients for thin films.
Integrated Ferroelectrics,
Vol. 35,
Issue. 1-4,
p.
299.
Defaÿ, Emmanuel
Zinck, Christophe
Malhaire, Christophe
Baboux, Nicolas
and
Barbier, Daniel
2006.
Modified free vibrating beam method for characterization of effective e31 coefficient and leakage resistance of piezoelectric thin films.
Review of Scientific Instruments,
Vol. 77,
Issue. 10,
Yu, Y H
Lai, M O
and
Lu, L
2007.
Measurement of thin film piezoelectric constants using x-ray diffraction technique.
Physica Scripta,
Vol. T129,
Issue. ,
p.
353.
Pronin, I. P.
Kaptelov, E. Yu.
Senkevich, S. V.
Klimov, V. A.
Zaĭtseva, N. V.
Shaplygina, T. A.
Pronin, V. P.
and
Kukushkin, S. A.
2010.
Crystallization of thin polycrystalline PZT films on Si/SiO2/Pt substrates.
Physics of the Solid State,
Vol. 52,
Issue. 1,
p.
132.
Potu, Supraja
Kulandaivel, Anu
Gollapelli, Buchaiah
Khanapuram, Uday Kumar
and
Rajaboina, Rakesh Kumar
2024.
Oxide based triboelectric nanogenerators: Recent advances and future prospects in energy harvesting.
Materials Science and Engineering: R: Reports,
Vol. 161,
Issue. ,
p.
100866.