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Electric Field Enhancement of Electron Emission from DX Centers and Consequences
Published online by Cambridge University Press: 25 February 2011
Abstract
We present data which show that electron emission from the DX center is sensitive to the Poole-Frenkel effect. We demonstrate that this result implies that the DX center is an L effective-mass state of the donor impurity accompanied by a small lattice relaxation. We show that all the observations so far obtained on this center are in agreement with this model.
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- Research Article
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- Copyright © Materials Research Society 1990
References
1
Khachaturyan, K.A., Awschalom, D.D., Rozen, J.R. and Weber, E.R., Phys. Rev. Lett.
63, 1311 (1989).Google Scholar
4
Morante, J.R., Samitier, J., Cornet, A. and Hems, A., Appl. Phys. Lett.
45. 1317 (1984).Google Scholar
6
Stievenard, D., Lannoo, M. and Bourgoin, J.C., Solid State Electron.
28. 485 (1985).Google Scholar
8
Lang, D.V. in Deep Centers in Semiconductors, edited by Pantelides, S.T. (Gordon and Breach, New York, 1986), chap. 7.Google Scholar
9
von Bardeleben, H.J., Bourgoin, J.C., Basmajin, P. and Gibart, P., Phys. Rev.
B 40, 5892 (1989).Google Scholar
10
Mooney, P.M., Northrop, G.A., Morgan, T.N. and Grimmeis, H.G., Phys. Rev.
B 37, 8298 (1988).Google Scholar
15
Mooney, P.M., Theis, T.N. and Wright, S.L. in Defects in Semiconductors. Material Sci. Forum 38–41. edited by von Bardeleben, H.J. (Trans Tech Publ. Aedermannsdorf, Switzerland, 1989), p. 1109.Google Scholar
16
Mizuta, M., Tachikawa, M., Kukimoto, H. and Minamura, S., Japan J. Appl. Phys.
24, L143 (1985).Google Scholar
17
Shan, W., Yu, P.Y., Li, M.F., Hansen, W.L. and Bauser, E., Phys. Rev.
B 40, 7831 (1982).Google Scholar
20
Gibart, P., Williamson, D.L., El Jani, B. and Basmagi, P., Phys. Rev.
B 38, 1885 (1988).Google Scholar
22
Feng, S.L., Bourgoin, J.C., von Bardeleben, H.J., Barbier, E., Hirtz, J.P. and Mollot, F., presented at the Proc. Mat. Res. Soc. Meeting, San Diego, USA, 1989, to be published.Google Scholar