Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-27T02:04:47.396Z Has data issue: false hasContentIssue false
  • English
  • Français

Elastic strains in polycrystalline UO2 samples implanted with He: micro Laue diffraction measurements and elastic modeling

Published online by Cambridge University Press:  22 March 2013

Axel Richard ,
Etienne Castelier ,
Herve Palancher ,
Jean-Sebastien Micha  and
Philippe Goudeau
Axel Richard
Affiliation:
CEA, DEN, DEC/SESC, Centre de Cadarache, 13 108 St Paul lez Durance, France
Etienne Castelier
Affiliation:
CEA, DEN, DEC/SESC, Centre de Cadarache, 13 108 St Paul lez Durance, France
Herve Palancher
Affiliation:
CEA, DEN, DEC/SESC, Centre de Cadarache, 13 108 St Paul lez Durance, France
Jean-Sebastien Micha
Affiliation:
CEA, INAC, 38 054 Grenoble Cedex 9, France
Philippe Goudeau
Affiliation:
Institut Pprime, CNRS-Universite de Poitiers-ENSMA, BP 30179 - 86 962 Futuroscope, France
Get access

Abstract:

In the framework of the study of long-term storage of the spent nuclear fuel, polycrystalline UO2 samples have been implanted with He ions. The thin implanted layer, close to the free surface is subjected to elastic stresses which are studied by x-ray diffraction (micro Laue diffraction) and a mechanical modeling. A simple expression of the displacement gradient tensor has been evidenced; it concerns only three terms (ε3, ε4 and ε5) which strongly evolve with considered grain orientations. Finally, we show that results obtained with micro diffraction are in very good agreement with conventional x-ray diffraction measurements done in laboratory at macro scale.

Keywords

ion-implantationx-ray diffraction (XRD)stress/strain relationship
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1514: Symposium HH – Advances in Materials for Nuclear Energy , 2013 , pp. 125 - 130
Copyright
Copyright © Materials Research Society 2013 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Phillpot, S. R., El-Azab, A., Chernatynskiy, A., Tulenko, J. S., JOM 63(8) (2011)10.1007/s11837-011-0143-xCrossRefGoogle Scholar
Michel, A., Sabathier, C., Carlot, G., Kaïtasov, O., Bouffard, S., Garcia, P., Valot, C., Nucl. Instrum. Methods Phys. Res. Sect. B 272, 218 (2012)10.1016/j.nimb.2011.01.069CrossRefGoogle Scholar
Chung, J.-S. and Ice, G., Journal of Applied Physics 86, 5249 (1999)10.1063/1.371507CrossRefGoogle Scholar
Richard, A., PhD Thesis, Poitiers university, France, 2012 Google Scholar
Richard, A., Palancher, H., Castelier, E., Micha, J.-S., Gamaleri, M., Carlot, G., Rouquette, H., Goudeau, P., Martin, G., Rieutord, F., Piron, J. P., Garcia, P., Journal of Applied Crystallography 45, 826 (2012)10.1107/S0021889812027665CrossRefGoogle Scholar
Debelle, A., Boulle, A., Garrido, F., Thomé, L., Journal of Materials Science 46, 4683(2011)10.1007/s10853-011-5375-1CrossRefGoogle Scholar
Weber, W., Radiation Effects 83, 145 (1984).10.1080/00337578408215798CrossRefGoogle Scholar