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Efficient Focusing with an Ultra-Low Effective-Index Lens Based on Photonic Crystals

Published online by Cambridge University Press:  01 February 2011

Eugen Foca ,
Helmut Föll ,
Frank Daschner ,
Vladimir V. Sergentu ,
Jürgen Carstensen ,
Reinhard Knöchel  and
Ion M. Tiginyanu
Eugen Foca
Affiliation:
Chair for General Materials Science, Faculty of Engineering, Christian-Albrechts-University of Kiel, Kiel, Germany Institute of Applied Physics, Technical University of Moldova, Chisinau, Moldova;
Helmut Föll
Affiliation:
Chair for General Materials Science, Faculty of Engineering, Christian-Albrechts-University of Kiel, Kiel, Germany
Frank Daschner
Affiliation:
Microwave Laboratory, Faculty of Engineering, Christian-Albrechts-Universityof Kiel, Kiel, Germany.
Vladimir V. Sergentu
Affiliation:
Institute of Applied Physics, Technical University of Moldova, Chisinau, Moldova;
Jürgen Carstensen
Affiliation:
Chair for General Materials Science, Faculty of Engineering, Christian-Albrechts-University of Kiel, Kiel, Germany
Reinhard Knöchel
Affiliation:
Microwave Laboratory, Faculty of Engineering, Christian-Albrechts-Universityof Kiel, Kiel, Germany.
Ion M. Tiginyanu
Affiliation:
Institute of Applied Physics, Technical University of Moldova, Chisinau, Moldova;
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Abstract

This work focuses on photonic crystals (PC) that can be ascribed an effective index of refraction > 1 or even > 0. We investigate the possibility to design optical elements (in this case a lens) based on this type of PC. A new approach for determining the effective refractive index of PCs with unusual index of refraction is used, which is simpler than earlier methods based on analyzing equi-frequency surfaces in k-space. An ultra-low refractive index PC is given a form approximating a concave lens and is proven theoretically and experimentally that it efficiently focuses the electromagnetic radiation in the microwave range. Strong focusing effects are found for both polarizations (TE and TM mode). Intensity gains as large as 35 for TM polarizations and 29 for TE polarizations are found. Measurements are in a good accordance with simulations.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 869: Symposium D – Materials, Integration and Technology for Monolithic Instruments , 2005 , D4.4
Copyright
Copyright © Materials Research Society 2005

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References

[1] Notomi, M., Phys. Rev. B 62, 10696 (2000)Google Scholar
[2] Foca, E.aet al., Phys. Stat. Sol. (a) 202, 4, R35–R37 (2005)Google Scholar
[3] Veselago, V.G., Usp. Sov. Fiz., 10, 509 (1968)Google Scholar
[4] Li, L.-M., Zhang, Z.-Q., Phys. Rev. B 58, 9587 (1998)Google Scholar
[5] Felbacq, D., Tayeb, G., Maystre, D., J. Opt. Soc. Am. A 11, 2526 (1994)Google Scholar
[6] Gupta, Bikash C. and Ye, Zhen, Phys. Rev. B 67, 153109 (2003)Google Scholar
[7] Gupta, Bikash C. and Ye, Zhen, J. Appl. Phys. 94(4), 2173 (2003); Suxia Yang et al., Phys. Rev. Lett. 93(2), 024301 (2004)Google Scholar
[8] Sergentu, V.V.et al., Phys. Stat. Sol. (a) 201, R31 (2004)Google Scholar