Hostname: page-component-cd9895bd7-q99xh Total loading time: 0 Render date: 2024-12-27T02:29:11.697Z Has data issue: false hasContentIssue false

Effects of Thickness and Indenter Geometry in Nanoindentation of Nickel Thin Films

Published online by Cambridge University Press:  01 February 2011

Padma Parakala
Affiliation:
Department of Engineering Technology, University of North Texas, Denton, TX 76203
Reza A. Mirshams
Affiliation:
Department of Engineering Technology, University of North Texas, Denton, TX 76203
Seifollah Nasrazadani
Affiliation:
Department of Engineering Technology, University of North Texas, Denton, TX 76203
Kun Lian
Affiliation:
Department of Engineering Technology, University of North Texas, Denton, TX 76203
Get access

Abstract

Effects of thickness and tip geometry on Ni thin films deposited on Cu substrate were studied using nanoindenter. The deformation mechanisms in correlation to hardness measurements were discussed at various loads and depths of penetration. The Berkovich, Cube corner and Conical tips have been used in this study. Initially, the hardness and modulus of elasticity were measured at a depth of 10% of film thickness. The depth of penetration was increased to 20% to observe the depth effects. Analysis of data showed that there is an Indentation Size Effect (ISE) irrespective of indenter tip geometries.

Type
Research Article
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1) Li, X. and Bhushan, B., Materials Characterization 48, 11(2002).Google Scholar
2) Pharr, G.M., Materials Science and Engineering A 253, 151(1998).Google Scholar
3) Pharr, G. M., Oliver, W. C., and Brotzen, F. R., J. Mater. Res. 7, 613 (1992)Google Scholar
4) Fischer-Cripps, C., Nanoindentation (New York, Springer, 2002) p. 19.Google Scholar
5) Lia, X., Bhushana, B., Takashimab, K., Baekc, C-W, Kimc, Y-K, Ultramicroscopy 97, 481494, (2003).Google Scholar
6) Hsu, Tai-Ran, MEMS and Microsystems Design and Manufacture, (Mc Graw Hill, 2002) p. 235268.Google Scholar
7) Rodriguez, R., Gutierrez., I., Materials Science and Engineering A 361, 377384(2003).Google Scholar
8) Nix, WD, Gao, H. J Mech Phys Solids 46, 411–25 (1998)Google Scholar
9) Swadener, J. G., P Georgeq, E., M Pharr, G., J. Mech. Phys. Solids 50, 681694 (2002)Google Scholar
10) Pethica, J. B., Hutchings, R., Oliver, And W.C., Phil. Mag. A 48, 593 (1983)Google Scholar
11) Pharr, G. M., Oliver, W. C., and Brotzen, F. R., J. Mater. Res. 7, 613 (1992)Google Scholar
12) Doerner, M. F. and Nix, W. D., J. Mater. Res. 1, 601 (1986)Google Scholar
13) Nix, W.D, Gao, , J Mech Phys Solids 46, 411–25 (1998).Google Scholar
14) Thomas, G.J., Siegel, R. W., and Eastman, J. A, Scripta Metall. Mater. 24, 201 (1990)Google Scholar
15) Tsui, T. Y., Oliver, W. C., and Pharr, G. M, in Indenter geometry effects on the measurement of mechanical properties by nanoindentation with sharp indenters (Mat. Res. Soc. Symp. Proc, 439, 1997) pp. 147152.Google Scholar
16) Tsui, T. Y., Vlassak, Joost, Nix, W. D., J. Mater. Res., 14, 2196 (1999)Google Scholar
17) Kramer, D. E., Volinsky, A.A., Moody, N. R., and Gerberich, W. W., J. Mater. Res., 16, 3150 (2001).Google Scholar
18) Dehm, G., Inkson, B.J., Balk, T. J., Wagner, T., and Arzt, E., in Influence of film/substrate interface structure on plasticity in metal thin films, (Mat. Res. Symp. Proc., 673, 2001) pp. 2.6.1–2.6.11Google Scholar
19) Hay, J. L., Pharr, G. M., Instrumented Indentation Testing, ASM Hand book, vol. 8.Google Scholar
20) Oliver, WC, Pharr, GM. J Mater Res. 7, 1564 (1992).Google Scholar
21) Saha, Ranjana, Nix, William D., Acta Materialia 50, 2338 (1992).Google Scholar