Hostname: page-component-78c5997874-4rdpn Total loading time: 0 Render date: 2024-11-19T04:14:56.235Z Has data issue: false hasContentIssue false

Effects Of Sintering Atmosphere On Defects In SiO2:GeO2 Vad Fiber

Published online by Cambridge University Press:  25 February 2011

A. Kashiwazaki
Affiliation:
Optical Fiber Division, Showa Electric Wire & Cable Co., Ltd., Minamihashimoto, Sagamihara-shi 299
K. Muta
Affiliation:
Optical Fiber Division, Showa Electric Wire & Cable Co., Ltd., Minamihashimoto, Sagamihara-shi 299
M. Kohketsu
Affiliation:
Department of Inorganic Materials, Tokyo Institute of Technology, Ohokayama, Meguro- Ku, Tokyo 152, Japan
H. Kawazoe
Affiliation:
Department of Inorganic Materials, Tokyo Institute of Technology, Ohokayama, Meguro- Ku, Tokyo 152, Japan
Get access

Abstract

Effects of the sintering atmosphere for 90SiO2 :10GeO2 preform-rods produced by VAD process were examined. The sintering atmosphere was changed from reducing to oxidizing, and the type and relative concentration of defects were estimated by photoluminescence, UV absorption and ESR absorption. Reducing condition accelerated the formation of defects, because these centers were considered to be the intermediate products of the thermal decomposition reaction of GeO2 which gives rise to reduction of Ge(IV) to Ge(II).

Type
Research Article
Copyright
Copyright © Materials Research Society 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Griscom, D. L., J. Non-crystalline Solids 73, 51 (1985)Google Scholar
2. Kawazoe, H., “Drawing or Photon Induced Effects in Silica-Based Waveguide,” Proceedings, this symposium.Google Scholar
3. Kohketsu, M., Kawazoe, H., Kashiwazaki, A. and Muta, K., “Photo-Luminescence of SiO:GeO2 VAD Fibers Heat-Treated Under Reducing Conditions,” Proceedings, this symposium.Google Scholar
4. Watanabe, Y., Kawazoe, H., Shibuya, K. and Muta, K., Jap. J. Appl. Phys. 25 (3), 425431 (1986).Google Scholar