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Effects of Plastic Deformation on Charge Transport in Mercuric Iodide Radiation Detectors

Published online by Cambridge University Press:  26 February 2011

J. Marschall ,
F. Milstein ,
G. Georgeson  and
V. Gerrish
J. Marschall
Affiliation:
Departments of Materials and Mechanical Engineering, University of California, Santa Barbara, CA 93106
F. Milstein
Affiliation:
Departments of Materials and Mechanical Engineering, University of California, Santa Barbara, CA 93106
G. Georgeson
Affiliation:
Boeing Aerospace, Defense and Space Group, Seattle, WA 98124–2499
V. Gerrish
Affiliation:
EG&G Energy Measurements, Inc., Santa Barbara Operations, Goleta, CA 93117
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Abstract

The effects of bulk plastic deformation of mercuric iodide (HgI2), upon electronic properties which are relevant to the performance of HgI2 as a radiation detector, were examined experimentally. Hole lifetimes, as well as hole and electron mobilities, were measured at various stages of sample deformation. Hole lifetimes decreased by a factor of 2 under strains of several percent; carrier mobilities did not change significantly, except during creep loading where electron and hole mobilities decreased by about 65% and 25%, respectively. Additionally, dark current measurements were made on specimens with varying degrees of accumulated plastic strain; dark current values did not strongly reflect the extent of plastic damage in deformed specimens.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 226: Symposium H – Mechanical Behavior of Materials and Structures in Microelectronics , 1991 , 351
Copyright
Copyright © Materials Research Society 1991

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