Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-25T15:39:11.839Z Has data issue: false hasContentIssue false

Effects of Microstructure and Chemical Composition on Ebic Contrast in Hem Solar Cell Silicon

Published online by Cambridge University Press:  21 February 2011

T.D. Sullivan*
Affiliation:
Dept.of Materials Science and Engineering350 Bard Hall, Cornell University, Ithaca, NY 14853
Get access

Abstract

EBIC images of an HEM solar cell display extensive spatial innomogenieties in the production of short-circuit current. TEM imaging reveals a variety of morphologies having dimensions on the order of 10 Um embedded in the material.Correlation of a region with high current collection to one or these distinct morphological regions suggests that segregation or B is responsible for the EBIC contrast.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Leamy, H.J., Kimerling, L.C., Ferris, S.D., Scanning Electron Microscopy/1976 (Part IV), Chicago, pp. 529–538.Google Scholar
2. Heydenreich, J., Blumtritt, H., Gleichmann, R., Johansen, H., Scanning Electron Microscopy/1981 (Part I), AMF O'Hare (Chicago) pp. 351–365.Google Scholar
3. Strunk, H., Cunningham, B., Ast, D., in “Detects in Semiconductors,” MRS Symposia Proc.2, Boston, Narayan, J., Tan, T.Y., eds.(North-Holland, New York 1980) pp. 297302.Google Scholar
4. Johnson, S.M., Armstrong, R.W., Rosemeier, R.G., Storti, G.M., Lin, B.C., Regnault, W.F., in “Grain Boundaries in Semiconductors”, MRS Symposia Proc. 5, Boston, Leamy, H.J., Pike, G.E., Seager, C.H., eds. (North-Holland, New York (1981) pp.179184.Google Scholar
5. Everhart, T.E., Hoif, P.R., J.Appl.Phys., 42, 13 (1971).Google Scholar