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Effects of Hydrogen Dilution on a-Si:H and its Solar Cells Studied by Raman and Photoluminescence Spectroscopy

Published online by Cambridge University Press:  17 March 2011

Guozhen Yue ,
Jessica M. Owens ,
Jennifer Weinberg-Wolf ,
Daxing Han ,
Jeffrey Yang ,
Kenneth Lord ,
Boajie Yan  and
Subhendu Guha
Guozhen Yue
Affiliation:
Department of Physics & Astronomy, University of North Carolina at Chapel Hill, Chapel Hill, NC 27599-3255
Jessica M. Owens
Affiliation:
Department of Physics & Astronomy, University of North Carolina at Chapel Hill, Chapel Hill, NC 27599-3255
Jennifer Weinberg-Wolf
Affiliation:
Department of Physics & Astronomy, University of North Carolina at Chapel Hill, Chapel Hill, NC 27599-3255
Daxing Han
Affiliation:
Department of Physics & Astronomy, University of North Carolina at Chapel Hill, Chapel Hill, NC 27599-3255
Jeffrey Yang
Affiliation:
United Solar Systems Corp., 1100 W Maple Road, Troy, Michigan 48084
Kenneth Lord
Affiliation:
United Solar Systems Corp., 1100 W Maple Road, Troy, Michigan 48084
Boajie Yan
Affiliation:
United Solar Systems Corp., 1100 W Maple Road, Troy, Michigan 48084
Subhendu Guha
Affiliation:
United Solar Systems Corp., 1100 W Maple Road, Troy, Michigan 48084
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Abstract

a-Si:H films and their n-i-p solar cells were prepared using plasma-enhanced CVD. The samples were prepared with no-, low-, standard, and high-H dilution. Raman and photoluminescence (PL) were used to characterize the i-layer. The main results are (a) Raman shows typical a-Si:H mode except for a c-Si peak in the 450 nm-thick film with high-H dilution, and (b) PL shows two regimes. (I) Below the onset of microcrystallinity characterized by x-ray diffraction, a blue-shift of the 1.4 eV PL peak energy and a decrease of the band width occur. (II) Above the onset of microcrystallinity, the PL efficiency decreases by a factor of 4-5, and the PL peak energy is red-shifted toward 1.2 eV as the μc-Si volume fraction is increased. In addition, the solar cell open circuit voltage shows first an increase and then a decrease, correlating with the PL peak energy position. We conclude that the PL spectroscopy is a sensitive tool for characterizing the gradual amorphous-to-microcrystalline structural transition in thin film solar cells.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 664: Symposium A – Amorphous and Heterogeneous Silicon-Based Films-2001 , 2001 , A9.7
Copyright
Copyright © Materials Research Society 2001

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References

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