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Effects of Ferromagnetic Capping Layers on the Perpendicular Anisotropy of Ni/Cu(001) Films.

Published online by Cambridge University Press:  15 February 2011

W. L. O'Brien
Affiliation:
Synchrotron Radiation Center, University of Wisconsin-Madison, 3731 Schneider Drive, Stoughton, WI 53589
B. P. Tonner
Affiliation:
Synchrotron Radiation Center, University of Wisconsin-Madison, 3731 Schneider Drive, Stoughton, WI 53589 Department of Physics, University of Wisconsin- Milwaukee, 1900 East Kenwood Blvd., Milwaukee, WI 53211
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Extract

The effects of ferromagnetic capping layers on the perpendicular magnetic anisotropy of Ni/Cu(001) have been studied. X-ray magnetic circular dichroism was used to obtain element specific magnetic information, including hysteresis loops for both in-plane and perpendicular magnetization. A 15 ML Ni/Cu(001) film maintains its perpendicular magnetic orientation after the addition of a 2.5 ML Fe capping layer. The Fe capping layer reduces the area of the Ni hysteresis loop by a factor of 2.0. A 2.0 ML capping layer of Co on 15 ML Ni/Cu(001) switches the easy axis of magnetization from perpendicular to in-plane.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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References

1 Neel, L., J. Phys. Rad. 15, 376 (1954).Google Scholar
2 Gay, J. G. and Richter, R., Phys. Rev. Lett. 56, 2729 (1986).Google Scholar
3 Thomassen, J., May, F., Feldmann, B., Wuttig, M., and Ibach, H., Phys. Rev. Lett, 69, 3831 (1992).Google Scholar
4 Kief, M. T. and Egelhoff, W. F., J. Appl. Phys. 73, 6195 (1993).Google Scholar
5 O'Brien, W. L. and Tonner, B. P., Phys. Rev. B 49, 15370 (1994).Google Scholar
6 Hansen, R. W. C., O'Brien, W. L. and Tonner, B. P., Nucl. Instrum. Methods, Phys. Res. A 347, 148 (1994).Google Scholar
7 Li, H. and Tonner, B. P., Phys. Rev. B 40, 10241 (1989).Google Scholar
8 Johnson, K. E., Chambliss, D. D., Wilson, R. J. and Chiang, S., J. Vac. Sci. Technol. A 11, 1654 (1993).Google Scholar
9 O'Brien, W. L. and Tonner, B. P., Phys. Rev. B 50, 2963 (1994).Google Scholar