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Effects of dislocations and sub-grain boundaries on X-ray response maps of CdZnTe radiation detectors

Published online by Cambridge University Press:  11 August 2011

A. Hossain ,
A. E. Bolotnikov ,
G. S. Camarda ,
Y. Cui ,
R. Gul ,
K. Kim ,
B. Raghothamachar ,
G. Yang  and
R. B. James
A. Hossain
Affiliation:
Brookhaven National Laboratory, Upton, NY, USA
A. E. Bolotnikov
Affiliation:
Brookhaven National Laboratory, Upton, NY, USA
G. S. Camarda
Affiliation:
Brookhaven National Laboratory, Upton, NY, USA
Y. Cui
Affiliation:
Brookhaven National Laboratory, Upton, NY, USA
R. Gul
Affiliation:
Brookhaven National Laboratory, Upton, NY, USA
K. Kim
Affiliation:
Brookhaven National Laboratory, Upton, NY, USA
B. Raghothamachar
Affiliation:
Stony Brook University, Stony Brook, NY, USA
G. Yang
Affiliation:
Brookhaven National Laboratory, Upton, NY, USA
R. B. James
Affiliation:
Brookhaven National Laboratory, Upton, NY, USA
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Abstract

The imperfect quality of CdZnTe (CZT) crystals for radiation detectors seriously diminishes their suitability for different applications. Dislocations and other dislocation-related defects, such as sub-grain boundaries and dislocation fields around Te inclusions, engender significant charge losses and, consequently, cause fluctuations in the detector’s output signals, thereby hindering their spectroscopic responses. In this paper, we discuss our results from characterizing CZT material by using a high-spatial-resolution X-ray response mapping system at BNL’s National Synchrotron Light Source. In this paper, we emphasize the roles of these dislocation-related defects and their contributions in degrading the detector’s performance. Specifically, we compare the effects of the sub-grain- and coherent twin-boundaries on the X-ray response maps.

Keywords

defectsdislocationsdevices
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1341: Symposium U – Nuclear Radiation Detection Materials , 2011 , mrss11-1341-u05-02
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

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