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Effects of Co-Dopants on the Microstrucutre and El Properties of the Zns:Mn Luminescence Materials

Published online by Cambridge University Press:  10 February 2011

Qing Zhai ,
Jinghong Li ,
Jay Lewis ,
Karen Waldrip ,
Kevin Jones ,
Paul Holloway ,
M. Puga-Lambers  and
Mark Davidson
Qing Zhai
Affiliation:
Dept. of Materials Science and Engineering
Jinghong Li
Affiliation:
Dept. of Materials Science and Engineering
Jay Lewis
Affiliation:
Dept. of Materials Science and Engineering
Karen Waldrip
Affiliation:
Dept. of Materials Science and Engineering
Kevin Jones
Affiliation:
Dept. of Materials Science and Engineering
Paul Holloway
Affiliation:
Dept. of Materials Science and Engineering
M. Puga-Lambers
Affiliation:
Microfabritech University of Florida, Gainesville, FL 32611
Mark Davidson
Affiliation:
Microfabritech University of Florida, Gainesville, FL 32611
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Abstract

Thin films of zinc sulfide (ZnS) doped with Mn, were deposited using magnetron sputter source. The electroluminescent properties of the as-deposited films were relatively poor. Post- deposition rapid thermal annealing (RTA) with and without co-dopants was studied. Significant changes in microstructure and EL performance were observed on the samples after post-sputter processing. Transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM) were employed to characterize the microstructure. Both inter-grain and intra-grain distributions of the co-dopants were measured using energy dispersive X-ray spectra (EDX) and the distribution versus thickness was determined by dynamic secondary ion mass spectrometry (SIMS). A correlation between electroluminescent properties and the microstructure is obtained.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 560: Symposium E – Luminescent Materials , 1999 , 21
Copyright
Copyright © Materials Research Society 1999

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References

REFERENCES

1 Ihanus, J., Ritala, M., Leskela, M., Prohaska, T., Resch, R., Friedbacher, G., Grasserbauer, M., Applied Surface Science, 120, 43 (1997).Google Scholar
2 Ono, Y. A., Electroluminescent Displays, World Scientific, Singapore (1995).Google Scholar
3 Migita, M., Kanehisa, O., Shiiki, M., and Yamamoto, H., J. Cryst. Trowth, 93, 686, (1988).Google Scholar
4 Blackmore, J. M., and Cullis, A. G., Thin Solid Films, 199, 321, (1991).Google Scholar
5 Mikami, A., Terada, K., Okibayashi, K., Tanaka, K., Yoshida, M., and Nakajima, S., J. Appl. Phys., 72, 773, (1992).Google Scholar
6 Steinberger, I. T., Polytypism in Zinc Sulfide, 7, (1982).Google Scholar
7 Chen, C., Husurianto, S., and Koretsky, M. D., J. Electrochem. Soc., 145, 226, (1998).Google Scholar
8 Loginov, Y. Y., Brown, P. D., and Humphreys, C. J., Inst. Phys. Conf. Ser. 146, 431, (1995).Google Scholar
9 Rack, P. D., and Holloway, P. H., Mat. Sci. Eng. R21, 171, (1998).Google Scholar
10 Wang, C. W., Sheu, T. J., Su, Y. K., Yokoyama, M., App. Sur. Sci. 113/114, 709, (1997)K.Google Scholar
11 , Waldrip, Lewis, J., Zhai, Q., Davidson, M., Holloway, P., to be published.Google Scholar
12 Shih, S., Keir, P. D., Wager, J. F., and Viljanen, J., J. Appl. Phys. 78, 5775, (1995).Google Scholar