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Effect of the Extinction Distance in X-Ray Rocking Curve Analyses of II-VI Compounds

Published online by Cambridge University Press:  26 February 2011

P.D. Moran  and
R.J. Matyi
P.D. Moran
Affiliation:
Dept. Of Materials Science And Engineering, University of Wisconsin, Madison, WI 53706
R.J. Matyi
Affiliation:
Dept. Of Materials Science And Engineering, University of Wisconsin, Madison, WI 53706
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Abstract

Double crystal x-ray rocking curves from single crystal CdTe and CdZnTe of various degrees of crystalline perfection were recorded under diffraction conditions in which the extinction distance varied from under 10 microns to more than 100 microns. In crystals of intermediate quality the rocking curves recorded under conditions of long extinction length showed structure not evident in those recorded under conditions of short extinction length. Integrated reflectivity measurements were performed at both long and short extinction lengths. The results have been interpreted within the framework of a transition from kinematic to dynamical diffraction.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 209: Symposium K – Defects in Materials , 1990 , 463
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

1) Armstrong, R.W., in Characterization of Crystal Growth Defects by X-ray Methods (New York: Plenum, 1980) p. 333.Google Scholar
2) Schwartz, L.H. and Cohen, J.B., Diffraction from Materials (New York: Springer-Verlag, 1987).Google Scholar
3) James, R.W., Solid State Physics, 15, 53 (1963).Google Scholar
4) Roessler, B. and Armstrong, R.W., Adv. X-ray Analysis, 12, 139 (1969).Google Scholar
5) Khan, A.A., Allred, W.P., Dean, B., Hooper, S., Hawkey, J.E. and Johnson, C.J., J.Electron. Mater., 15, 181 (1986).Google Scholar
6) Schneider, J.R., J. Appl. Cryst., 7, 547 (1974).Google Scholar