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Effect of Surface Coverage on Porous Silicon Photoluminescence: Transmission FTIR Studies
Published online by Cambridge University Press: 15 February 2011
Abstract
Transmission Fourier Transform Infrared (FTIR) Spectroscopy was utilized to monitor the effect of surface coverage on photoluminescent porous silicon. These experiments were performed in situ in an ultrahigh vacuum (UHV) chamber to correlate simultaneously surface coverage and photoluminescence intensity. The goal of these FTIR and photoluminescence studies was to clarify the mechanism of the photoluminescence from porous silicon.
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- Copyright © Materials Research Society 1992
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