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Effect of Radiation in Solid during SiC Sublimation Growth

Published online by Cambridge University Press:  01 February 2011

Shin-ichi Nishizawa
Affiliation:
[email protected], National Institute of Advanced Industrial Science and Technology, Power Electronics Research Center, Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki, 305-8568, Japan
Shin-ichi Nakashima
Affiliation:
[email protected], National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, 305-8568, Japan
Tomohisa Kato
Affiliation:
[email protected], National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, 305-8568, Japan
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Abstract

The effect of infrared absorption on SiC sublimation growth was numerically investigated. At first, absorption coefficient was estimated as function of doping concentration. Then temperature distribution inside a crucible was numerically analyzed with taking account of absorption in growing crystal. It was pointed out that temperature distribution in a growing crystal strongly depends on absorption coefficient, i.e. doping concentration. As increasing the absorption coefficient, the growth front temperature and temperature gradient inside a growing crystal increase. It might cause large thermal stress and affect the grown crystal quality. This agrees well with growth features in experiment. The growth condition should be determined with taking account of absorption coefficient, i.e. doping concentration.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

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References

1 Nishizawa, S., Kato, T., Kitou, Y., Oyanagi, N., Hirose, F., Yamaguchi, H., Bahng, W. and Arai, K., Materials Science Forum 457–640, 29 (2004).Google Scholar
2 Nishizawa, S., Michikawa, Y., Kato, T., Hirose, F., Oyanagi, N. and Arai, K., Materials Science Forum 433–436, 13(2003).Google Scholar
3 Müller, St.G., Glass, R. C., hobgood, H.M., Tsvetkov, V.F., Brady, M., Henshall, D., Jenny, J.R., Malta, D. and carter, C.H. Jr., J.Crystal Growth 211, 325(2000)Google Scholar
4 Zhmakin, I.A., Kulik, A.V., Karpov, S.Y., Demina, S.E., Ramm, M.S. and Makarov, Y.N., Diamond and Related Mater. 9, 446 (2000)Google Scholar
5 Ma, R.H., Zhang, H., Ha, S. and Skowronski, M., J.Crystal Growth 252, 523 (2003)Google Scholar
6 Selder, M., Kadinski, L., Durst, F. and Hofmann, D., J.Crystal Growth 226, 501(2001).Google Scholar
7 http://www.cfdrc.comGoogle Scholar
8 Harima, H., Nakashima, S. and Uemura, T., J.Appl.Phys. 78, 1996 (1995).Google Scholar
9 Macmillan, M.F., Henry, A. and Janzén, E., J. Electronic Materials 27, 300(1998).Google Scholar