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The Effect of Ionizing Radiation on Nickel-Doped MgO.

Published online by Cambridge University Press:  21 February 2011

J. L. Boldú ,
E. Muñoz P. ,
K. L. Tsang ,
M. M. Abraham  and
Y. Chen
J. L. Boldú
Affiliation:
Instituto de Física, U.N.A.M., Apartado Postal 20-364, 01000 México, D. F.
E. Muñoz P.
Affiliation:
Instituto de Física, U.N.A.M., Apartado Postal 20-364, 01000 México, D. F.
K. L. Tsang
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37830
M. M. Abraham
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37830
Y. Chen
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37830
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Abstract

Defect and impurity valence changes induced by γ irradiation of nickel- doped MgO crystals are studied using magnetic resonance and optical techniques.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 24: Symposium B – Defect Properties and Processing of High-Technology Nonmetallic Materials , 1983 , 141
Copyright
Copyright © Materials Research Society 1984

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References

REFERENCES

1. Moulton, P.F., Mooradian, A., Chen, Y., and Abraham, M. M., Bull. Am. Ceram. Soc. 59. 350 (1980).Google Scholar
2. Narayan, J. and Chen, Y.. J. Appl. Phys. 51,1242 (1980).CrossRefGoogle Scholar
3. Abraham, M. M., Butler, C. T., and Chen, Y., J. Chem. Phys. 55,3752 (1971).CrossRefGoogle Scholar
4. Abraham, M. M., Unruh, W. P., and Chen, Y., Phys. Rev. B 10,3540 (1974).CrossRefGoogle Scholar
5. Unruh, W. P., Abraham, M. M., and Chen, Y., Phys. Rev. Lett. 30,446 (1973).Google Scholar
6. Abraham, M. M., Chen, Y., and Unruh, W. P., Phys. Rev. B 9,1842 (1974).Google Scholar
7. Boldú, J. L.,Muńoz P., E., Abraham, M. M., and Chen, Y. (to be published).Google Scholar
8. Halliburton, L. E., Kappers, L. A., Cowan, D. L., Dravnieks, F., and Wertz, J. E., Phys. Rev. Lett. 30,607 (1973).CrossRefGoogle Scholar
9. Halperin, A., and Braner, A. A., Phys. Rev. 117,408 (1960).Google Scholar
10. Chen, R., J. Appl. Phys. 40,570 (1969).CrossRefGoogle Scholar
11. Searle, T. M., Glass, A. M., J. Phys. Chem. Sol. 29,609 (1968).Google Scholar
12. Sibley, W. A., Kolopus, J. L., and Mallard, W. C., Phys. Status Solidi 31,223 (1969) and references therein.CrossRefGoogle Scholar
13. Datta, S.,Boswarba, I. M. and Holt, D. B., J. Phys. Chem. Sol. 40,567 (1979).CrossRefGoogle Scholar