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Effect of Dry Oxidation on the Performance of Carbon Nanotube Arrays Electrochemical Capacitors

Published online by Cambridge University Press:  23 March 2012

Adrianus I. Aria  and
Morteza Gharib
Adrianus I. Aria
Affiliation:
Graduate Aeronautical Laboratories, California Institute of Technology, Pasadena, CA 91125, U.S.A.
Morteza Gharib
Affiliation:
Graduate Aeronautical Laboratories, California Institute of Technology, Pasadena, CA 91125, U.S.A.
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Abstract

In this study, the effect of dry oxidation on the electrochemical properties of carbon nanotube arrays is investigated. Oxygenated surface functional groups were introduced to the arrays by oxygen plasma treatment, where their surface concentrations were varied by controlling the exposure time. The finding presented herein shows an augmentation of nearly thirty times in term of specific capacitance when the arrays are oxidized. Similar behavior is also observed in the non-aqueous electrolytes where the specific capacitance of the oxidized carbon nanotube arrays is measured more than three times higher than that of the pristine ones. However, overexposure to oxygen plasma treatment reverses this effect. At such high oxidation level, the damage to the graphitic structure becomes more pronounced such that the capacitive behavior of the arrays is overshadowed by their resistive behavior. These findings are important for further development of carbon nanotube based electrochemical capacitors.

Keywords

energy storageoxidationC
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1407: Symposium AA – Carbon Nanotubes, Graphene and Related Nanostructures , 2012 , mrsf11-1407-aa10-55
Copyright
Copyright © Materials Research Society 2012

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References

REFERENCES

1. Frackowiak, E., Metenier, K., Bertagna, V. and Beguin, F., Appl. Phys. Lett. 77, 2421 (2000).Google Scholar
2. Barisci, J., Wallace, G. and Baughman, R., J. Electrochem. Soc. 147, 4580–4583 (2000).Google Scholar
3. Signorelli, R., Ku, D. C., Kassakian, J. G. and Schindall, J. E., Proc. IEEE 97, 1837–1847 (2009).Google Scholar
4. Simon, P. and Gogotsi, Y., Nat. Mater. 7, 845–854 (2008).Google Scholar
5. Chen, J. H., Li, W. Z., Wang, D. Z., Yang, S. X., Wen, J. G. and Ren, Z. F., 40, 1193–1197 (2002).Google Scholar
6. Fernandez, J., Arulepp, M., Leis, J., Stoeckli, F. and Centeno, T., Electrochim. Acta 53, 7111–7116 (2008).Google Scholar
7. Hummers, W. S. and Offeman, R. E., J. Am. Chem. Soc. 80, 1339 (1958).Google Scholar
8. Xu, T., Yang, J., Liu, J. and Fu, Q., Appl. Surf. Sci. 253, 8945–8951 (2007).Google Scholar
9. Pan, H., Li, J. Y. and Feng, Y. P., Nanoscale Res. Lett. 5, 654–668 (2010).Google Scholar
10. Aria, A. I. and Gharib, M., Langmuir 27, 9005–9011 (2011).Google Scholar