Hostname: page-component-cd9895bd7-8ctnn Total loading time: 0 Render date: 2024-12-27T01:58:05.710Z Has data issue: false hasContentIssue false
  • English
  • Français

Effect of doping on crystalline quality of rubidium titanyl phosphate (RTP) crystals grown by the TSSG method

Published online by Cambridge University Press:  09 October 2014

Jianqiu Guo ,
Balaji Raghothamachar ,
Michael Dudley ,
Joan J. Carvajal ,
Ali Butt ,
Maria Cinta Pujol ,
Rosam M Sole ,
Jaume Massons ,
Magdalena Aguilo  and
Francesc Diaz
Jianqiu Guo
Affiliation:
Department of Materials Science and Engineering, Stony Brook University, Stony Brook, NY 11794, USA
Balaji Raghothamachar
Affiliation:
Department of Materials Science and Engineering, Stony Brook University, Stony Brook, NY 11794, USA
Michael Dudley
Affiliation:
Department of Materials Science and Engineering, Stony Brook University, Stony Brook, NY 11794, USA
Joan J. Carvajal
Affiliation:
Physics and Crystallography of Materials and Nanomaterials (FiCMA-FiCNA), Universitat Rovira i Virgili (URV), Campus Sescelades, c/Marcel·lí Domingo s/n, E-43007 Tarragona, Spain
Ali Butt
Affiliation:
Physics and Crystallography of Materials and Nanomaterials (FiCMA-FiCNA), Universitat Rovira i Virgili (URV), Campus Sescelades, c/Marcel·lí Domingo s/n, E-43007 Tarragona, Spain
Maria Cinta Pujol
Affiliation:
Physics and Crystallography of Materials and Nanomaterials (FiCMA-FiCNA), Universitat Rovira i Virgili (URV), Campus Sescelades, c/Marcel·lí Domingo s/n, E-43007 Tarragona, Spain
Rosam M Sole
Affiliation:
Physics and Crystallography of Materials and Nanomaterials (FiCMA-FiCNA), Universitat Rovira i Virgili (URV), Campus Sescelades, c/Marcel·lí Domingo s/n, E-43007 Tarragona, Spain
Jaume Massons
Affiliation:
Physics and Crystallography of Materials and Nanomaterials (FiCMA-FiCNA), Universitat Rovira i Virgili (URV), Campus Sescelades, c/Marcel·lí Domingo s/n, E-43007 Tarragona, Spain
Magdalena Aguilo
Affiliation:
Physics and Crystallography of Materials and Nanomaterials (FiCMA-FiCNA), Universitat Rovira i Virgili (URV), Campus Sescelades, c/Marcel·lí Domingo s/n, E-43007 Tarragona, Spain
Francesc Diaz
Affiliation:
Physics and Crystallography of Materials and Nanomaterials (FiCMA-FiCNA), Universitat Rovira i Virgili (URV), Campus Sescelades, c/Marcel·lí Domingo s/n, E-43007 Tarragona, Spain
Get access

Abstract

Defect structures in Rubidium Titanyl Phosphate (RTP) crystals (non-doped and doped) grown by the Top Seeded Solution Growth (TSSG) method were characterized using Synchrotron White Beam X-ray Topography. Main defects observed in non-doped crystals are growth sector boundaries while both growth sector boundaries and growth striations are observed in the Nb single doped and (Nb,Yb)-codoped crystals with relatively few linear defects such as dislocations. Results show that the overall crystalline quality is lowered as more doping elements are incorporated. Details of defect distributions are correlated with the growth process to facilitate high quality growth of doped RTP.

Keywords

crystal growthdefectsx-ray diffraction (XRD)
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1698: Symposium II/JJ/KK – Materials, Processes and Devices for Nanophotonics, Nonlinear Optics and Resonant Optics , 2014 , mrss14-1698-jj03-07
Copyright
Copyright © Materials Research Society 2014 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Zumsteg, F.C., Bierlein, J.D., and Gier, T.E., Journal of Applied Physics 47, 4980(1976).CrossRefGoogle Scholar
Stucky, G.D., Phillips, M.L.F., and Gier, T.E., Chemistry of Materials 1, 492(1989).CrossRefGoogle Scholar
Carvajal, J.J., Sole, R., Gavalda, Jna., Massons, J., Aguilo, M., and Diaz, F., Optical Materials 24, 425(2003).CrossRefGoogle Scholar
Carvajal, J.J., Sole, R., Gavalda, Jna., Massons, J., Aguilo, M., and Diaz, F., Crystal Growth& Design 1, 479(2001).CrossRefGoogle Scholar
Carvajal, J.J., Nikolov, V., Sole, R., Gavalda, Jna., Massons, J., Rico, M., Zaldo, C., Aguilo, M., and Diaz, F., Chemistry of Materials 12, 3171(2000).CrossRefGoogle Scholar
Raghothamachar, B., Dhanaraj, G., Dudley, M. in Handbook of Crystal Growth, Dhanaraj, G., Byrappa, K., Prasad, V., Dudley, M., p. 1425, Springer (2010).CrossRefGoogle Scholar
Klapper, H., Becker, R.A., Schmiemann, D., and Faber, A., Crystal Research and Technology 37, 747(2002).3.0.CO;2-2>CrossRefGoogle Scholar