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Effect of Dopants on the Band Structure of Barium Strontium Titanate Thin Films

Published online by Cambridge University Press:  01 February 2011

Yuebing Zheng ,
Shijie Wang  and
Cheng Hon A. Huan
Yuebing Zheng
Affiliation:
Institute of Materials Research and Engineering, 3 Research Link, Singapore, 117602
Shijie Wang
Affiliation:
Institute of Materials Research and Engineering, 3 Research Link, Singapore, 117602
Cheng Hon A. Huan
Affiliation:
Institute of Materials Research and Engineering, 3 Research Link, Singapore, 117602
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Abstract

The effect of dopants on the band structure and crystal structure of Ba0.5Sr0.5TiO3thin films on (100) LaAlO3 substrates has been investigated. The dopants include Ti, Mg and Al. The band-gap energies of the thin films were determined from the transmission spectra measured by UVVIS spectrophotometer and increased with the increase of dopant concentration regardless of the type of dopants. The crystal structure was studied by using transmission electron microscopy, atomic force microscopy, x-ray diffraction and micro-Raman spectroscopy. The relation between band structure and crystal structure was discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 872: Symposium J – Micro- and Nanosystems—Materials and Devices , 2005 , J14.5
Copyright
Copyright © Materials Research Society 2005

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References

1 Hou, S. Y., Kwo, J., Watts, R. K., and Cheng, J. Y., Appl. Phys. Lett. 67, 1387 (1995).Google Scholar
2 Chen, C. L., Shen, J., Chen, S. Y., Luo, G. P., Chu, C. W., Miranda, F. A., F. W. Wan Keuls, Jiang, J. C., Meletis, E. I., and Chang, H. Y., Appl. Phys. Lett.78, 652 (2001).Google Scholar
3 Lee, J. S., Wang, H., Lee, S. Y., Foltyn, S. R., and Jia, Q. X., Appl. Phys. Lett. 83, 5494 (2003).Google Scholar
4 Pontes, F. M., Leite, E. R., Pontes, D. S. L., Longo, E., Santos, E. M. S., Mergulhao, S., Pizani, P. S., Lanciotti, F. Jr, Boschi, T. M., and Varela, J. A., J. Appl. Phys. 91, 5972 (2002).Google Scholar
5 Wang, Y. P., and Tseng, T. Y., J. Mater. Sci.34, 4573 (1999).Google Scholar
6 Panda, B., Dhar, A., Nigam, G. D., Bhattacharya, D., and Ray, S. K., Thin Solid Films 332, 46 (1998).Google Scholar
7 Zheng, Y. B., Wang, S. J., Huan, A. C. H., Tan, C. Y., Yan, L. and Ong, C. K., Appl. Phys. Lett. 86, 112910 (2005).Google Scholar
8 Jia, Q. X., Park, B. H., Gibbons, B. J., Huang, J. Y., and Lu, P., Appl. Phys. Lett.81, 114 (2002).Google Scholar
9 Im, J., Auciello, O., Baumann, P. K., Streiffer, S. K., Kaufman, D. Y., and Krauss, A. R., Appl. Phys. Lett. 76, 625 (2000).Google Scholar
10 Cole, M. W., Nothwang, W. D., Hubbard, C., Ngo, E., and Ervin, M., J. Appl. Phys. 93, 9218 (2003).Google Scholar
11 Cole, M. W., Hubbard, C., Ngo, E., Ervin, M., Wood, M. and Geyer, R. G., J. Appl. Phys. 92, 475 (2002).Google Scholar
12 Joshi, P. C., and Cole, M. W., Appl. Phys. Lett.77, 289 (2000).Google Scholar
13 Chang, W., and Sengupta, L., J. Appl. Phys. 92, 3941 (2002).Google Scholar
14 Dobal, P. S., Dixit, A., Katiyar, R. S., Garcia, D., Guo, R., and Bhalla, A. S., J. Raman Spectrosc. 32, 147 (2001).Google Scholar
15 Barsani, D., Lottici, P. P., Ding, X. Z., Appl. Phys. Lett. 72, 73 (1998).Google Scholar
16 Sanjurjo, J. A., Lopez-Cruz, E., and Burns, G., Phys. Rev. B 28, 7260 (1983).Google Scholar
17 Bao, D. H., Yao, X., Wakiya, N., Shinozaki, K., and Mizutani, N., Appl. Phys. Lett. 79, 3767 (2001).Google Scholar
18 Wang, Y. and Heron, N., J. Phys. Chem. 95, 525 (1991).Google Scholar
19 Hodes, G., Yaron, A. A., Decker, F., and Motisuka, P., Phys. Rev. B 36, 4215 (1987).Google Scholar
20 Tcheliebou, F., Ryu, H. S., Hong, C. K., Park, W. S., and Baik, S., Thin Solid Films 305, 30 (1997).Google Scholar
21 Bao, D. H., Gu, H. S., and Kuang, A. X., Thin Solid Films 312, 37 (1998).Google Scholar
22 Merzy, C., Kunzery, M., Kaufmanny, U., Akasakiz, I. and Amanoz, H., Semicond. Sci. Technol. 11, 712 (1996).Google Scholar
23 Ng, W. L., Lourenco, M. A., Gwilliam, R. M., Ledain, S., Shao, G., and Homewood, K. P., Nature 410, 192 (2001).Google Scholar