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Published online by Cambridge University Press: 10 February 2011
In this work we report some results concerning Raman characterisation of covalently bonded amorphous carbon based thin films (∼ 100 nm) of binary alloys, obtained by ion implantation of carbon ions into silicon and germanium matrices. It will be shown that compositional disorder is present in our samples even below the stoichiometric concentration (∼50 carbon at.%) as deduced by the presence of three vibrational features in the Raman spectra. A quantitative measure of the compositional disorder will be also given by using either Raman or infrared spectroscopies in samples with different carbon content.