Hostname: page-component-cd9895bd7-gxg78 Total loading time: 0 Render date: 2024-12-27T01:32:27.106Z Has data issue: false hasContentIssue false
  • English
  • Français

Effect of Annealing on the Properties of thin Films of Free Base Phthalocyanine and Perylene-3,4,9,10-Tetracarboxylic Dianhydride Deposited by Organic Molecular Beam Deposition

Published online by Cambridge University Press:  10 February 2011

S.M. Bayliss ,
S. Heutz ,
G. Rumbles  and
T.S. Jones
S.M. Bayliss
Affiliation:
Department of Chemistry and Centre for Electronic Materials and Devices, Imperial College, London, SW7 2AY, UK
S. Heutz
Affiliation:
Department of Chemistry and Centre for Electronic Materials and Devices, Imperial College, London, SW7 2AY, UK
G. Rumbles
Affiliation:
Department of Chemistry and Centre for Electronic Materials and Devices, Imperial College, London, SW7 2AY, UK
T.S. Jones
Affiliation:
Department of Chemistry and Centre for Electronic Materials and Devices, Imperial College, London, SW7 2AY, UK
Get access

Abstract

Organic molecular beam deposition (OMBD) has been used to deposit thin films of free base phthalocyanine (H2Pc) and perylene-3,4,9,10-tetracarboxylic dianhydride (PTCDA). The structural, optical and morphological properties of the films have been measured as a function of annealing temperature using x-ray diffraction (XRD), electronic absorption spectroscopy and atomic force microscopy (AFM). A phase transition, (α-β), is observed for H2Pc films which is accompanied by changes in the bulk film properties and surface morphology. In the case of PTCDA increasing temperature does not affect the structural and optical properties of the film, but different surface morphologies are observed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 560: Symposium E – Luminescent Materials , 1999 , 71
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1) Forrest, S. R.; Chem. Rev. 97, p. 1793 (1997).Google Scholar
2) Gu, G., Khalfin, V., Forrest, S. R.; Appl. Phys. Lett., 73 (17), p. 2399 (1998), S. A. van Slyke, C. H. Chen, C. W. Tang; Appl. Phys. Lett., 69, p. 2160, (1996).Google Scholar
3) Shen, Z., Burrows, P.E., Bulovic, V., Forrest, S. R., Thompson, M.E., Science, 276, p. 2009 (1997).Google Scholar
4) Mindorff, M. S., Brodie, D. E.; Coord. Chem. Rev., 156, p. 237 (1996).Google Scholar
5) , Mobus, Karl, N., Kobayashi, T., J. Cryst. Growth, 116, p. 495 (1992).Google Scholar
6) Cook, M.J. in Advances in Spectroscopy: Spectroscopy of New Materials, Ed. Clarke, R.J.H., and Hester, R. E., 22, p. 87 (1993).Google Scholar
7) Gould, R. D., Coord. Chem. Rev., 156, p. 237 (1996)Google Scholar
8) Bayliss, S. M., Rumbles, G., Jones, T. S., (in preparation)Google Scholar
9) Ashida, M., Uyeda, N., Suito, E., J. Cryst. Growth, 8, p. 45 (1971)Google Scholar
10) Shen, Z., Burrows, P. E., Forrest, S. R., Zian, M., Steier, W. H., Chem. Phys. Lett., 236, p. 129 (1995)Google Scholar
11) Nanai, N., Yudasaka, N., Ohki, Y., Yoshimura, S., Thin Solid Films, 265, 1–2, (1995)Google Scholar