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Effect of Ammonium Acetate on the Properties of Chemical Bath Deposited CdS Films

Published online by Cambridge University Press:  29 January 2014

Abeer A. Al-Yafeai ,
Sovannary Phok ,
Sahar A. Al-Shaibani ,
Shifaa M. Al-Baity ,
Esmaeel M. Al-Hammadi  and
Falah S. Hasoon
Abeer A. Al-Yafeai
Affiliation:
National Energy and Water Research Center, Abu Dhabi Water and Electricity Authority, P.O. Box 54111, Abu Dhabi, United Arab Emirates.
Sovannary Phok
Affiliation:
National Energy and Water Research Center, Abu Dhabi Water and Electricity Authority, P.O. Box 54111, Abu Dhabi, United Arab Emirates.
Sahar A. Al-Shaibani
Affiliation:
National Energy and Water Research Center, Abu Dhabi Water and Electricity Authority, P.O. Box 54111, Abu Dhabi, United Arab Emirates.
Shifaa M. Al-Baity
Affiliation:
National Energy and Water Research Center, Abu Dhabi Water and Electricity Authority, P.O. Box 54111, Abu Dhabi, United Arab Emirates.
Esmaeel M. Al-Hammadi
Affiliation:
National Energy and Water Research Center, Abu Dhabi Water and Electricity Authority, P.O. Box 54111, Abu Dhabi, United Arab Emirates.
Falah S. Hasoon
Affiliation:
National Energy and Water Research Center, Abu Dhabi Water and Electricity Authority, P.O. Box 54111, Abu Dhabi, United Arab Emirates.
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Abstract

This investigation is a comprehensive study of the effect of ammonium acetate on the electrical, optical, morphology and microstructure of CdS thin films grown by Chemical Bath Deposition method (CBD). Two sets of CdS thin films (A and B) were deposited on glass substrates at 60°C for 60 min. The films were deposited using chemical bath solution that consists of cadmium acetate, ammonium hydroxide, and thiourea. However, ammonium acetate was added into the chemical bath used to deposit set (B), where ammonium acetate was eliminated from bath solution used to deposit set (A). The films’ morphology was examined by Field Emission Scanning Electron Microscopy (FE-SEM), whereas, the chemical composition was investigated by Electron Probe Micro-Analyzer (EPMA). The X-Ray Diffraction (XRD) θ/2θ technique was applied to study the structure of the films. Atomic Force Microscopy (AFM) was used to measure the average surface roughness of the films, and Dektak Profilometer was used to determine the CdS films thickness. The optical and electrical properties for the films were determined using UV-Vis-NIR Spectrometer, and the Hall Effect technique, respectively. The highest carrier mobility was obtained for the films deposited in an ammonium acetate free bath. However, both films were polycrystalline with hexagonal structure exhibiting a tendency toward <002> texture, that increase with increasing the pH value of the chemical bath.

Keywords

thin filmmorphologycrystallographic structure
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1630: Symposium O – Solution Processing of Inorganic and Hybrid Materials for Electronics and Photonics , 2014 , mrsf13-1630-o03-31
Copyright
Copyright © Materials Research Society 2014 

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