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Dynamics of Graphite Photoablation

Published online by Cambridge University Press:  25 February 2011

P. T. Murray
Affiliation:
Research Institute, University of Dayton, Dayton, OH 45469-0167 Graduate Materials Engineering, University of Dayton, Dayton, OH 45469-0246
D.T. Peeler
Affiliation:
Graduate Materials Engineering, University of Dayton, Dayton, OH 45469-0246 Clare Boothe Luce Scholar
D. V. Dempsey
Affiliation:
Research Institute, University of Dayton, Dayton, OH 45469-0167
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Abstract

Speed distributions were determined for the ions, ground state and electronicallyexcited neutrals ejected from a graphite target by 248 nm laser ablation. Mass distributions were measured for the laser-ejected ions. The measurements were carried out normal to the graphite target as well as at an angle of 45°. Significant differences were observed in both the speed and mass distributions at the two angles.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

[1] Sato, T., Furuno, S., Iguchi, S., and Hanabusa, M., Jpn. J. Appl. Phys. 26, L1487 (1987).Google Scholar
[2] Wagal, S.S., Juengerman, E. M., and Collins, C.B., Appl. Phys. Lett. 53 187 (1988).Google Scholar
[3] Krishnaswamy, J., Rengan, A., Narayan, J., Vedam, K., and McHargue, C.J., Appl. Phys. Lett. 54, 2455 (1989).Google Scholar
[4] Collins, C.B., Danvaloo, F., Juengerman, E.M., Osborn, W.R., and Jander, D.R., Appl. Phys. Lett. 54, 316 (1989).Google Scholar
[5] Pivin, J.C., Spirckel, M., Allouard, M., and Rauturear, G., Appl.Phys. Lett. 57 2657 (1990).Google Scholar
[6] Martin, J.A., Vazquez, L., Bernard, P., Comin, F., and Ferrer, S., Appl. Phys. Lett. 57 1742 (1990).Google Scholar
[7] Danvaloo, F., Juengerman, E.M., Jander, D.R., Lee, T.J., and Collins, C.B., J. Appl. Phys. 67, 2081 (1990).Google Scholar
[8] Campbell, E.E.B., Ulmer, G., Bues, K., and Hertel, I.V., Appl.Phys. A, 48 543 (1989).Google Scholar
[9] Murray, P.T., Dyhouse, V.J., Grazulis, L., and Thomas, D.R., in Surface Chemistry and Beam-Solid Interactions (Mater. Res. Soc. Proc. 201, Pittsburgh, PA 1991) p. 513 Google Scholar